where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -

297 views
Classified Ads
Zheng Liu
Zheng Liu
00:53 Feb-05-2008
Call for Paper

------------------------------------------------------------------------------------------------------------------------
Special Issue - Integrated Imaging and Vision
Techniques for Industrial Inspection

Imaging- and vision-based techniques play an important role in industrial inspection. The sophistication of the techniques assures high-quality performance of the manufacturing process through precise positioning, online monitoring, and real-time classification. Advanced systems incorporating multiple imaging and/or vision modalities provide robust solutions to complex situations and problems in industrial applications. A diverse range of industries, in-
cluding aerospace, automotive, electronics, pharmaceutical, biomedical, semiconductor, and food/beverage, etc., have benefited from recent advances in multi-modal imaging, data fusion, and computer vision technologies. The purpose of this special issue is to highlight such advances and demonstrate the successful applications of multi-modal imaging and vision technologies in industrial inspection.

Papers that advance the theories of multi-modal imaging, data fusion, and vision techniques or tackle challenges in practical applications are invited. In addition to conventional vision technologies, imaging modalities of interest include X-ray , Terahertz imaging, and ultrasonic testing. The contributions should be original and must not have been presented and/or published (or currently under consideration) in any other form.

Topics include (but are not limited to) the following:
▪ Automated defect identification and classification with multi-modal imaging techniques;
▪ Multi-sensor image fusion for inspection;
▪ Multi-modal vision system design and implementation;
▪ Precise measurements with 3D vision and multi-modal geometry reconstruction;
▪ Registration of multi-modal inspection data;
▪ Multi-camera system and array for inspection;
▪ Multi-spectrum imaging and analysis;
▪ Visualization of multi-modal nondestructive inspection data;
▪ 3D volumetric image processing;
▪ Other applications.

Machine Vision and Applications accepts high-quality technical contributions which are within its aims and scope in both long and short paper formats. Long papers may not be over 30 manuscript pages in length (12 point type, double-spaced, 5 cm margins (2 inch) on one side of the paper only) including figures, references, acknowledgements, footnotes, tables, and captions. All papers should be written in English. Further guidelines can be viewed at http://www.springerlink.com/content/100522/.
Deadline for submission: August 31, 2008

GUEST EDITORS
Dr. Zheng Liu
Institute for Research in Construction
National Research Council Canada
Dr. Hiroyuki Ukida
Department of Mechanical Engineering
Tokushima University
Dr. Pradeep Ramuhalli
Department of Electrical and Computer Engineering
Michigan State University
Dr. David S. Forsyth
NDE Division
Texas Research International Inc./Austin

Submitting Your Manuscript
Machine Vision and Applications employs a completely automated submission and review process. To submit a manuscript, please visit http://mc.manuscriptcentral.com/mva. If you are new to Manuscript Central, please use the “Create Account” link in the top right corner of the page to create a new account. Once you have created an account you will have access to your Author Dashboard. More information can be found regarding use of Manuscript Central in the
Help section of the website.

Machine Vision and Applications publishes high-quality technical contributions in machine vision research and development. Specifically, the editors encourage submittals in all applications and engineering aspects of image-related computing. In particular, original contributions dealing with scientific, commercial, industrial, military, and biomedical applications of machine vision, are all within the scope of the journal. Particular emphasis is placed on engineering and technology aspects of image processing and computer vision.

For further information regarding Machine Vision and Applications, please contact: Sheli Carr, Editorial Coordinator mva_ec(at)bellsouth.net
------------------------------------------------------------------------------------------------------------------------


 
 

Product Spotlight

MUSE Mobile Ultrasonic Equipment

The MUSE, a portable ultrasonic imaging system, was developed for in-field inspections of light-weig
...
ht structures. The MUSE consists of a motor-driven manipulator, a water circulation system for the acoustic coupling and a portable ultrasonic flaw detector (USPC 3010). The MUSE provides images of internal defects (A-, B-,C- and D-scan).
>

NDT.net launches mobile-friendly design

NDT.net has revamped its website providing a mobile-friendly design.The front page received a comp
...
letely new design and all other sections are now reacting responsively on mobile devices. This has been a major step to make our website more user- friendly.
>

Ultrasonic Testing Immersion Tanks with Unmatched Scanning Features

TecScan’s non-destructive testing Ultrasonic Immersion Tanks & scanners are designed for high pe
...
rformance and demanding NDT testing applications. Our Scan3D™ line of High Precision Immersion Tanks are specifically designed for automated ultrasonic testing of complex composites parts used in aerospace and industrial applications.
>

CIVA 2020 UT Module

CIVA NDE Simulation Software is the world leader of NDT Simulation. The UT simulation Module incl
...
udes: - "Beam computation": Beam propagation simulation - "Inspection Simulation": Beam interaction with flaws or specimens The user can simulate a whole inspection process (pulse echo, tandem or TOFD) with a wide range of probes (conventional, Phased- arrays or EMAT), components, and flaws.
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window