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where expertise comes together
- since 1996 -

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F.D.LEO DAVID
Sales,
India, Joined Feb 2002, 3

F.D.LEO DAVID

Sales,
India,
Joined Feb 2002
3
03:39 Jul-04-2008
Looking for Dealers

NDT SUPPLIES, INDIA - Manufacturer of NDT & Dark room Accessories is interested to appoint Dealers in all the countries.

Companies interested may send their profile to Mr. Leo David, Manager - Operations to ndtsupplies@satyam.net.in



    
 
 

Product Spotlight

FlexoFORM™

The FlexoFORM™ solution integrates flexible phased array probe technology in a scanner to solv
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e the challenges that come with inspecting pipe elbows. When combined with a water column, this solution can be used to collect easy-to-interpret data on elbows with diameters ranging from 4.5 in. OD up to flat and offers many benefits.
>

SONOAIR - air-coupled Phased Array Ultrasonic Inspection System

For highly attenuating materials, the performance of the system is critical. The ultrasonic sensors,
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the scanning area and the system settings should be flexibly adapted to the test task and the material. These high expectations are met with the new and modular testing system SONOAIR. With the world’s first air-coupled phased-array UT inspection system SONOAIR we developed a technology that works with up to 4 transmitter and receiver channels with freely configurable square wave burst transmitters as wells as low noise receiving amplifiers.
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XRHRobotStar

In high volume industries like automotive the requirement for a hundred percent X-ray inspection c
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reates a bottleneck in the production. The XRHRobotStar is a fully Automated Defect Recognition (ADR) capable robot-system that allows an ultra-fast in-line inspection.
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FMC/TFM

Next generation for Phased Array UT is here now with FMC/TFM! Have higher resolution imaging, impr
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oved signal to noise ratio, characterize, size and analyze defects better with access to several wave mode views and save raw FMC data for higher quality analysis.  Some of the benefits are:
  • Beautiful Image! Easier to understand what you're looking at
  • Completely focused in entire image or volume
  • Much easier to define setups before inspection
  • Easier to decipher geometry echoes from real defects
  • Oriented defects (e.g. cracks) are imaged better
  • See image from different wave modes from one FMC inspection
  • FMC data can be reprocessed/analyzed without going back to the field
>

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