where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -

655 views
Technical Discussions
Ed Ginzel
R & D, -
Materials Research Institute, Canada, Joined Nov 1998, 1307

Ed Ginzel

R & D, -
Materials Research Institute,
Canada,
Joined Nov 1998
1307
09:26 Sep-19-1996
TOFD Probes

Most probes used for TOFD are circular or nearly square.
Would it be feasible or practical to use a rectangular
shaped element to effectively increase the energy input
to a thick test piece? e.g. a 6mm x 18mm element. The
small vertical dimension (6mm) would be intended to
preserve the increased divergence angle needed for TOFD.

If so, would the receiver probe need to be of the same
dimension?




 
 Reply 
 
Rathgeb/Meier
Rathgeb/Meier
09:17 Sep-20-1996
Re: TOFD Probes
: Most probes used for TOFD are circular or nearly square.
: Would it be feasible or practical to use a rectangular
: shaped element to effectively increase the energy input
: to a thick test piece? e.g. a 6mm x 18mm element. The
: small vertical dimension (6mm) would be intended to
: preserve the increased divergence angle needed for TOFD.

: If so, would the receiver probe need to be of the same
: dimension?

Many thanks for your question.

Siemens does not have so much experience in TOFD-technique,but
we asked experts from AEA in England. AEA did some investigations
to this problem and have bad experience with squared ore rectangular
shaped probes: The parallel edges of squared or rectangular probes
cause interferencies due to diffraction at the crystal edges.
This will reduce your signal to noise ratio and should therefore
be avoided. AEA experience is, that in case of steel material the
diameter of the probe is not so much limited.

If you do need an increase of energy and want to get a smaler
beam width in the horizontal direction, you should better use
elliptical transducers.

To cover a maximal area of inspection, the beam width of the
transmitter and the receiver should correspond.




 
 Reply 
 

Product Spotlight

MUSE Mobile Ultrasonic Equipment

The MUSE, a portable ultrasonic imaging system, was developed for in-field inspections of light-weig
...
ht structures. The MUSE consists of a motor-driven manipulator, a water circulation system for the acoustic coupling and a portable ultrasonic flaw detector (USPC 3010). The MUSE provides images of internal defects (A-, B-,C- and D-scan).
>

OPBOX with standard software is able to do all types of inspections and measurements: flaw detection in welds and materials, scanning of objects, testing composite materials, forged and moulded pieces, many UT inspections, measurements of properties of ma

Typical applications: UT measurements with pulse technique, Measurement of thicknesses also at hig
...
h temperatures, Measurements of properties of materials, including fluids and gases We are delivering a standard version of the software (for any Microsoft Windows up to 10 x64 with Microsoft Hardware certification report Approved) and for special needs: SDK with ready to use examples for LabView, MATLAB x64, C++ wrapper for dll, Python and Linux., and also low-level description of how to control our devices directly from any USB tools
>

FMC/TFM

Next generation for Phased Array UT is here now with FMC/TFM! Have higher resolution imaging, impr
...
oved signal to noise ratio, characterize, size and analyze defects better with access to several wave mode views and save raw FMC data for higher quality analysis.  Some of the benefits are:
  • Beautiful Image! Easier to understand what you're looking at
  • Completely focused in entire image or volume
  • Much easier to define setups before inspection
  • Easier to decipher geometry echoes from real defects
  • Oriented defects (e.g. cracks) are imaged better
  • See image from different wave modes from one FMC inspection
  • FMC data can be reprocessed/analyzed without going back to the field
>

Micro CT

nanoVoxel series has nano-scale resolution upto 500nm by using high voltage X-ray source (from 80-
...
300 kV) with micro/nano focal spot and highly sensitive flat panel detectors and unique Optical coupling detector.
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window