I am thinking about working on a research topic and I would like to check its likely implementation. Is there any possible industrial application for measuring the thicknesses and characteristic impedances (or sound velocities) of layered media by means of ultrasonic waves? Specifically, I am talking about a method for discerning between materials on a substrate, whose characteristic impedances do not differ by more than ~30%. No limitation in the number of layers and a first guess is that the detectable range of thicknesses goes from 0.1mm upwards. The analysis below 0.1mm should be treatable, but not at this stage. An additional option is the detection of non uniform impedance patterns varying as a function of depth within a material. I guess that this last case should be observable in materials that are exposed to temperature processes or other kinds of fabrication treatments.
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