- since 1996 -
Research and Application Development For NDT
Acuren’s Research and Application Development specializes in the development of advanced ultraso
nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications.
UCI Hardness Tester NOVOTEST T-U2
UCI hardness tester NOVOTEST T-U2 is is used for non-destructive hardness testing of: metals and
alloys by scales of hardness: Rockwell (HRC), Brinell (HB), Vickers (HV); non-ferrous metals, alloys of iron etc., and using five additional scales for calibration; with tensile strength (Rm) scale determines the tensile strength of carbon steel pearlitic products by automatic recalculation from Brinell (HB) hardness scale.
Typical Phased Array probes have frequencies between 1MHz and 20MHz and the number of wafers is 10
to 128. M2 Electronics offers customers conventionally ultrasound probes and the ability to provide high-precision Phased Array Ultrasound Probes of up to 256 wafers. We can also customize the probe for our customers to meet the specific application requirements of the user.
VeeScan AirCraft Wheel Inspection
The VEESCAN offers maximum flexibility, has a proven mechanical design and records of breakdown-fr
ee operation of over 365 days. Appealing to companies in the Aerospace industry, the VEESCAN is ideal for all wheel-testing environments. With a wide selection of probes, the VeeScan allows your wheel testing facility the flexibility to select the most compatible configurations with their workload.