where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
649 views
Technical Discussions
ovidiu iuga
NDT Inspector, thermography
ISCIR, Romania, Joined Dec 2005, 16

ovidiu iuga

NDT Inspector, thermography
ISCIR,
Romania,
Joined Dec 2005
16
14:22 Dec-03-2009
E 155 Al and Mg reference radiographs

Hi everyboby

Can anyone pls. send me the reference radiographs for inspection of Al and Mg castings

Thanks in advance

Ovidiu

 
 Reply 
 
Nigel Armstrong
Engineering, - Specialist services
United Kingdom, Joined Oct 2000, 1096

Nigel Armstrong

Engineering, - Specialist services
United Kingdom,
Joined Oct 2000
1096
11:47 Dec-04-2009
Re: E 155 Al and Mg reference radiographs
In Reply to ovidiu iuga at 14:22 Dec-03-2009 (Opening).

Hi Ovidiu

Good luck in obtaining these for free as they are expensive items and as such unlikely to be released for free. I assume you have asked the end-user (your customer?) to supply. Failing that, perhaps you could borrow from someone locally - a local aerspace manufacturing company perhaps?

Good luck.

 
 Reply 
 

Product Spotlight

NDTkit RT

NDTkit RT, TESTIA's Digital Radiography software The NDTkit product line software for X-ray analysi
...
s. NDTkit RT is a software benefiting from the Ultis kernel which is dedicated to radiographic image analysis. It offers a set of tools and filtering processes to assist RT operators in finding relevant flaws.
>

TraiNDE UT

TraiNDE UT is a virtual tool associated with a signal database which simulates real inspection con
...
ditions for numerous applications (Type A/V1 block, DAC block, welds and plates).
>

NDT.net launches mobile-friendly design

NDT.net has revamped its website providing a mobile-friendly design.The front page received a comp
...
letely new design and all other sections are now reacting responsively on mobile devices. This has been a major step to make our website more user- friendly.
>

NEW - TD Focus-ScanRX

The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
...
ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window