- since 1996 -
Research and Application Development For NDT
Acuren’s Research and Application Development specializes in the development of advanced ultraso
nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications.
OPBOX with standard software is able to do all types of inspections and measurements: flaw detection in welds and materials, scanning of objects, testing composite materials, forged and moulded pieces, many UT inspections, measurements of properties of ma
Typical applications: UT measurements with pulse technique, Measurement of thicknesses also at hig
h temperatures, Measurements of properties of materials, including fluids and gases We are delivering a standard version of the software (for any Microsoft Windows up to 10 x64 with Microsoft Hardware certification report Approved) and for special needs: SDK with ready to use examples for LabView, MATLAB x64, C++ wrapper for dll, Python and Linux., and also low-level description of how to control our devices directly from any USB tools
IntraPhase Athena Phased Array System
The Athena Phased Array system, manufactured by WesDyne NDE Products & Technology, consists of a pha
sed array acquisition system and PC running IntraSpect software. A PC is used to perform acquisition, analysis and storage of the data. System hardware is capable of operating up to four data sets with any combination of phased array or conventional UT probes. NOW AVAILABLE IN 64-64 CONFIGURATION.
nanoVoxel series has nano-scale resolution upto 500nm by using high voltage X-ray source (from 80-
300 kV) with micro/nano focal spot and highly sensitive flat panel detectors and unique Optical coupling detector.