- since 1996 -
FD800 Bench Top Flaw Detectors
The bench-top FD800 flaw detector range combines state-of-the-art flaw detection with advanced mater
ial thickness capabilities. Designed for use in the laboratory these gauges are the tool you need for all your flaw detecting needs.
NEOS III is Logos Imagings lightest DR system. With a built-in battery and internal wireless commu
nication, the NEOS III is perfect for users that want to quickly assess an item.
Navic - Steerable Modular Automated Scanner
The Navic is a modular, motorized, steerable scanner designed to carry multiple attachments used
in various scanning and inspection applications. The Navic is capable of weld scanning (girth welds and long seam welds), automated corrosion mapping, and tank scanning.
NDT Master Lecturer
In the program both university professors and practitioners will give lectures, which guarantees the
oretical depth and practical inside. Academic Director: Prof. Dr. Christian Boller
The following lecturers are not complete: Prof. Tadeusz Stepinski, Prof. Wieslaw Staszewski, Prof. Frank Walther, Prof. Giovanni Bruno, Prof. Gerd Dobmann, Prof. Philippe Guy