where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -

Sonatest Ltd
From our three distinct business centres in the UK, USA and CANADA, Sonatest design and produce a leading range of high performance ultrasonic NDT equipment and accessories.
276 views
Technical Discussions
Vasco Teixeira
R & D, coatings production and inspection, stress analysi
University of Minho - Physics Centre, Portugal, Joined Feb 2000, 3

Vasco Teixeira

R & D, coatings production and inspection, stress analysi
University of Minho - Physics Centre,
Portugal,
Joined Feb 2000
3
00:26 Jan-08-2002
non destructive analysis of interfacial decohesion in layered thin coatings

Dear NDT coolleagues

I am looking for researchers that have been using NDT techniques to study adherence problems in thin films and coatings (for protective and decorative applications). Namely, the micro defects and decohesion at interfaces between a coating and substrate (or within one interface of multilayered coatings).

I will appreciate very much information on the techniques used, papers published and experience.

Thanks

Wishes of an Happy New Year.

Vasco Teixeira



 
 Reply 
 
Richard Kazares
Richard Kazares
05:58 Jan-08-2002
Re: non destructive analysis of interfacial decohesion in layered thin coatings
We have applied High Frequency UT to measure the adherance of thin film materials to a variety of substrates. Our UltraWin software has a semi-automated Bond Analysis function to aid in the rapid interpretation (e.g. Go-No Go type) of C-Scan imaging data from just such material bonding issues.

I will also forward you (to your e-mail) a copy of an applications study detailing this type of work and capabilities - hope it helps you.

Richard Kazares

----------------------------------
Dear NDT coolleagues
.
: I am looking for researchers that have been using NDT techniques to study adherence problems in thin films and coatings (for protective and decorative applications). Namely, the micro defects and decohesion at interfaces between a coating and substrate (or within one interface of multilayered coatings).
.
: I will appreciate very much information on the techniques used, papers published and experience.
.
: Thanks
.
: Wishes of an Happy New Year.
.
: Vasco Teixeira
.



 
 Reply 
 

Product Spotlight

MUSE Mobile Ultrasonic Equipment

The MUSE, a portable ultrasonic imaging system, was developed for in-field inspections of light-weig
...
ht structures. The MUSE consists of a motor-driven manipulator, a water circulation system for the acoustic coupling and a portable ultrasonic flaw detector (USPC 3010). The MUSE provides images of internal defects (A-, B-,C- and D-scan).
>

Aerospace Systems - Automated Ultrasonic Inspection

USL are specialists in the design and manufacture of turnkey ultrasonic inspection systems for aer
...
ospace applications. From monolithic composites to complex honeycomb structures. This video shows just a few examples of what is possible, find out more at: www.ultrasonic-sciences.co.uk
>

HARDNESS TESTER TKM-459CE combi

TKM-459CE combi applies 2 methods of hardness control: UCI and Leeb. It provides high-accuracy tes
...
ting of metals and alloys as well as items of different sizes and configurations, their hardened layers and galvanic coatings. Device represents results in HB, HRC, HV and others. Shock-, dust- and water-proof housing with intuitive software make this gauge easy to use in all working conditions.
>

GEKKO - Portable Phased Array Testing with TFM in Real-Time

The portable phased array testing system GEKKO provides 64 parallel test channels. On creating testi
...
ng parameters the operator is assisted by the CIVA software. Due to its modular set-up the GEKKO instrument is suitable for operators of all skill levels.
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window