- since 1996 -
FAAST-PA! OEM Patented phased Array for high speed UT inspection
Multiangle, Multifocus, Multifrequency, Multibeam. Instead of stacking UT electronics and having m
any PA probes, FAAST-PA is able to transmit all delay laws within ONE single shot in Real time.
Research and Applications Development For NDT
The Research and Applications Development (RAD) group is a newly formed team within Acuren dedicat
ed to tackling challenging inspection problems. Our focus is the development of novel, field deployable, advanced inspection techniques for use in cases where standard NDT methods are ineffective. We don't wait for new innovations, we engineer them. From concept to commissioning.
GEKKO - Portable Phased Array Testing with TFM in Real-Time
The portable phased array testing system GEKKO provides 64 parallel test channels. On creating testi
ng parameters the operator is assisted by the CIVA software. Due to its modular set-up the GEKKO instrument is suitable for operators of all skill levels.
Compact NDT inspection-heads for measurements with active thermography
The compact inspection head is suitable for thermographic ndt tasks. The uncooled infrared camera
is specially developed for NDI-tasks and offers a thermal sensitivity until now known only from thermal imagers with cooled detector. All required components and functions are integrated into the inspection-head. You will only need an ethernet cable to connect the sensor with the evaluation system.