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EKOSCAN
EKOSCAN is a French manufacturer specialized in equipment for ultrasonic Non Destructive Testing: Probes,UT boards & Scanners tailored for your needs
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Technical Discussions
Yoseph Bar-Cohen
R & D,
Jet Propulsion Lab (JPL), USA, Joined Nov 1998, 26

Yoseph Bar-Cohen

R & D,
Jet Propulsion Lab (JPL),
USA,
Joined Nov 1998
26
06:27 Jul-23-2002
Call for Abstacts - 2003 SPIE's NDE and Homeland Security Conf.

Dear Colleague,

This is a friendly reminder about next week, July 31, 2002, due date for submittal of abstracts to the two upcoming SPIE conferences:
Smart NDE and Health Monitoring of Structural and Biological Systems (nd03) http://spie.org/Conferences/Calls/03/ss/confs/ND03.html

Nondestructive Detection and Measurement for Homeland Security (nd04) http://spie.org/Conferences/Calls/03/ss/confs/ND04.html

These SPIE's Conferences are part of the SPIE's Smart Structures and Materials/NDE Symposia offering the attendees a great opportunity to participate in multi-disciplinary forums related to NDE. Some of the interesting topics that are expected at this conference include papers on NDE for medical and biological applications, robotics, smart structures, MEMS, automation, microelectronics, criminology, forensic science, biometrics, geophysics, archeology and others.

These SPIE's Smart Structures and NDE Symposia will be held from 2 to 6 March, 2003, at the Town & Country Resort & Convention Center, San Diego, California USA.


Sincerely
Yosi
http://ndeaa.jpl.nasa.gov



    
 
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