- since 1996 -
nanoVoxel series has nano-scale resolution by using high voltage X-ray source (from 80-300 kV) wit
h micro focal spot and highly sensitive detector including different kinds of big size panel detectors and lens coupling CCD.
GEKKO - Portable Phased Array Testing with TFM in Real-Time
The portable phased array testing system GEKKO provides 64 parallel test channels. On creating testi
ng parameters the operator is assisted by the CIVA software. Due to its modular set-up the GEKKO instrument is suitable for operators of all skill levels.
IRIS 9000Plus - Introducing the next generation of heat exchanger inspection.
Representing the seventh generation of the IRIS system, the IRIS 9000 Plus has nearly 200 years of c
ombined field inspection experience incorporated in its design. This experience combined with a strong commitment to quality and a history of innovation has made Iris Inspection Services® the undisputed leader in IRIS technology.
Combination of Digital Image Correlation and Thermographic Measurements
The combination of measuring results from the digital image correlation (ARAMIS, DIC) and temperat
ure measuring data from infrared cameras permits the simultaneous analysis of the thermal and mechanical behavior of test specimens in the materials and components testing field.