- since 1996 -
Customized Probes and Transducers
With a strong development department and our own piezocomposite production, we accompany you from th
e first product idea to serial production. Our scientists are continuously researching new methods in the field of ultrasonic measurement technology. The progress achieved enables us to offer you optimal solutions.
FAAST-PA! OEM Patented phased Array for high speed UT inspection
Multiangle, Multifocus, Multifrequency, Multibeam. Instead of stacking UT electronics and having m
any PA probes, FAAST-PA is able to transmit all delay laws within ONE single shot in Real time.
OPBOX with standard software is able to do all types of inspections and measurements: flaw detection in welds and materials, scanning of objects, testing composite materials, forged and moulded pieces, many UT inspections, measurements of properties of ma
Typical applications: UT measurements with pulse technique, Measurement of thicknesses also at hig
h temperatures, Measurements of properties of materials, including fluids and gases We are delivering a standard version of the software (for any Microsoft Windows up to 10 x64 with Microsoft Hardware certification report Approved) and for special needs: SDK with ready to use examples for LabView, MATLAB x64, C++ wrapper for dll, Python and Linux., and also low-level description of how to control our devices directly from any USB tools
Research and Application Development For NDT
Acuren’s Research and Application Development specializes in the development of advanced ultraso
nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications.