where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -

470 views
Technical Discussions
Baosheng Li
Baosheng Li
03:09 Jan-25-1999
Stress determination using X-ray method

Dear All,
There was an article by D. Senczyk, K. Lis from Poznan University
of Technology on stress determination using X-ray diffraction on
issue No. 2 Vol. 3, NDTnet 1998 February. Could the experts in the
forum help me to learn more about this method? Any help wil be
appreciated.



    
 
 
Rolf Diederichs
Director, Editor
NDT.net, Germany, Joined Nov 1998, 602

Rolf Diederichs

Director, Editor
NDT.net,
Germany,
Joined Nov 1998
602
07:54 Jan-27-1999
Re: Stress determination using X-ray method
: Dear All,
: There was an article by D. Senczyk, K. Lis from Poznan University
: of Technology on stress determination using X-ray diffraction on
: issue No. 2 Vol. 3, NDTnet 1998 February. Could the experts in the
: forum help me to learn more about this method? Any help wil be
: appreciated.
---------------

I have no email access to the authors of this particular article.
http://www.ndt.net/article/dresd97/senczyk/senczyk.htm

For a start it may help you to brows the resources of NDTnet search features.

Results for: "stress and x-ray"

NDTnet Search: 87 matches
NDT Crawler: 46 matches

Good luck

Rolf





    
 
 

Product Spotlight

FAAST-PA! OEM Patented phased Array for high speed UT inspection

Multiangle, Multifocus, Multifrequency, Multibeam. Instead of stacking UT electronics and having m
...
any PA probes, FAAST-PA is able to transmit all delay laws within ONE single shot in Real time.
>

MUSE Mobile Ultrasonic Equipment

The MUSE, a portable ultrasonic imaging system, was developed for in-field inspections of light-weig
...
ht structures. The MUSE consists of a motor-driven manipulator, a water circulation system for the acoustic coupling and a portable ultrasonic flaw detector (USPC 3010). The MUSE provides images of internal defects (A-, B-,C- and D-scan).
>

X-ray CT aids research into defect formation in AM parts

X-ray CT is used to research how additive manufacturing process parameters influence defect format
...
ion in AM parts.
>

NDT.net launches mobile-friendly design

NDT.net has revamped its website providing a mobile-friendly design.The front page received a comp
...
letely new design and all other sections are now reacting responsively on mobile devices. This has been a major step to make our website more user- friendly.
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window
s