- since 1996 -
Pulse thermography is a non-contact test method that is ideal for the characterization of thin fil
ms and coatings or the detection of defects. With a remarquable short test time and a high detection sensitivity, the Telops TESTD-PT is the perfect tool for non- destructive testing. With such high frame rates, it is even possible to investigate highly conductive or diffusive materials.
M2M PANTHER is a phased-array equipment designed for both desktop and industrial applications, offer
ing unparalleled performance in a compact unit. It combines the speed required for industrial integrated Phased-Array Ultrasound (PAUT) solutions, with the most complete set of total focusing method (TFM) imaging techniques, making it the ultimate tool for R&D and procedure qualification.
Lyft™: Pulsed Eddy Current Reinvented
PEC Reinvented—CUI Programs Redefined Corrosion under insulation (CUI) is possibly the greatest u
nresolved asset integrity problem in the industry. Current methods for measuring wall thickness with liftoff, without removing insulation, all have severe limitations. Eddyfi introduces Lyft — a reinvented, high-performance pulsed eddy current (PEC) solution. The patent- pending system features a state-of-the-art portable instrument, real- time C-scan imaging, fast data acquisition with grid-mapping and dynamic scanning modes, and flexibility with long cables. It can also scan through thick metal and insulation, as well as aluminum, stainless steel, and galvanized steel weather jackets. Who else but Eddyfi to reinvent an eddy current technique and redefine CUI programs. Got Lyft?
Robotic laser shearography enables 100% inspection of complex, flight-critical composite structures
An article in “Composites World Magazine” showcases Non Destructive Testing of aero-structures
with Laser Shearography. Over the years Dantec Dynamics has supplied many solutions for the aerospace industry. Referring to specific customer projects several of these cases are examined to outline the advantages of using Laser Shearography for automated defect detection.