- since 1996 -
OmniScan™ X3 flaw detector
The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, like total focus
ing method (TFM) images and advanced visualization capabilities, enable you to complete your inspection with greater confidence.
The all-digital Novascope 6000 is a portable, ultra-high precision thickness gauge for high-speed
thickness measurement. Novascope 6000 has unmatched capabilities and unique features including: •Superior Resolution with high contrast, high-speed color RF display •High pulser voltage •Real-time video output •Increased internal/external data storage •Programmable SetUp features •Battery & AC Powered
Combination of Digital Image Correlation and Thermographic Measurements
The combination of measuring results from the digital image correlation (ARAMIS, DIC) and temperat
ure measuring data from infrared cameras permits the simultaneous analysis of the thermal and mechanical behavior of test specimens in the materials and components testing field.
GEKKO - Portable Phased Array Testing with TFM in Real-Time
The portable phased array testing system GEKKO provides 64 parallel test channels. On creating testi
ng parameters the operator is assisted by the CIVA software. Due to its modular set-up the GEKKO instrument is suitable for operators of all skill levels.