- since 1996 -
NEW - TD Focus-ScanRX
The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
NDT Master Lecturer
In the program both university professors and practitioners will give lectures, which guarantees the
oretical depth and practical inside. Academic Director: Prof. Dr. Christian Boller
The following lecturers are not complete: Prof. Tadeusz Stepinski, Prof. Wieslaw Staszewski, Prof. Frank Walther, Prof. Giovanni Bruno, Prof. Gerd Dobmann, Prof. Philippe Guy
FAAST-PA! OEM Patented phased Array for high speed UT inspection
Multiangle, Multifocus, Multifrequency, Multibeam. Instead of stacking UT electronics and having m
any PA probes, FAAST-PA is able to transmit all delay laws within ONE single shot in Real time.
UCI Hardness Tester NOVOTEST T-U2
UCI hardness tester NOVOTEST T-U2 is is used for non-destructive hardness testing of: metals and
alloys by scales of hardness: Rockwell (HRC), Brinell (HB), Vickers (HV); non-ferrous metals, alloys of iron etc., and using five additional scales for calibration; with tensile strength (Rm) scale determines the tensile strength of carbon steel pearlitic products by automatic recalculation from Brinell (HB) hardness scale.