where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
481 views
Technical Discussions
James JOE
R & D, Ultrasonic Specialist
ASNT,KSNT, South Korea, Joined Jan 2005, 5

James JOE

R & D, Ultrasonic Specialist
ASNT,KSNT,
South Korea,
Joined Jan 2005
5
01:02 Jan-06-2005
microcrack detect

Would you please let us know the instrument and probes to detect microcrack of packaging device of semiconductor?

best regards
James JOE


 
 Reply 
 
David GARNIER
David GARNIER
08:52 Jan-10-2005
Re: microcrack detect
Dear Mr JOE,

We wish you an happy new year 2005.

Regarding your request for microcrack detection in packaging device of smiconductor, we could propose you METALSCAN EPSILON UT high frequency system (high resolution immersion tank) which could reach with your requirements.

On request we could quote options with 3rd Z axes motorised and turntable.

Could you please send us more details or the full specification so that we could give you a more adapted answer (mainly regariding feasibility according to the dimension of defects, nature of material, etc)?

Awaiting for your next reply,

With our best regards,

David GARNIER,
Commercial Manager.
----------- Start Original Message -----------
: Would you please let us know the instrument and probes to detect microcrack of packaging device of semiconductor?
: best regards
: James JOE
------------ End Original Message ------------




 
 Reply 
 

Product Spotlight

IRIS 9000Plus - Introducing the next generation of heat exchanger inspection.

Representing the seventh generation of the IRIS system, the IRIS 9000 Plus has nearly 200 years of c
...
ombined field inspection experience incorporated in its design. This experience combined with a strong commitment to quality and a history of innovation has made Iris Inspection Services® the undisputed leader in IRIS technology.
>

32:128PR PAUT & 2-ch TOFD Flaw Detector: SyncScan 2

●32:128PR PAUT with optional 2-ch TOFD to maximize your efficiency ●Support PR mode for corrosi
...
on inspection ●Multiple solutions for welds & corrosion ●Faster scan speed (Approximately 3 meters/minute) ●Light weight: 4kg only including battery
>

FMC/TFM

Next generation for Phased Array UT is here now with FMC/TFM! Have higher resolution imaging, impr
...
oved signal to noise ratio, characterize, size and analyze defects better with access to several wave mode views and save raw FMC data for higher quality analysis.  Some of the benefits are:
  • Beautiful Image! Easier to understand what you're looking at
  • Completely focused in entire image or volume
  • Much easier to define setups before inspection
  • Easier to decipher geometry echoes from real defects
  • Oriented defects (e.g. cracks) are imaged better
  • See image from different wave modes from one FMC inspection
  • FMC data can be reprocessed/analyzed without going back to the field
>

TESTD-PT SYSTEM

Pulse thermography is a non-contact test method that is ideal for the characterization of thin fil
...
ms and coatings or the detection of defects. With a remarquable short test time and a high detection sensitivity, the Telops TESTD-PT is the perfect tool for non- destructive testing. With such high frame rates, it is even possible to investigate highly conductive or diffusive materials.
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window