where expertise comes together
- since 1996 -
- since 1996 -
NEW - TD Focus-ScanRX
The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
Echomac® PA Bar Tester
The Echomac® PA BT provides 100% inspection of round bars for core and surface defects, at speeds u
p to 2 m/sec, depending on the specific application. The unit allows producers to handle a much larger range of diameters in one installation, and is available in 3 models to test 10 – 75mm diameter (small model); 20 – 130mm (medium model) or 50 – 254mm (large model) bars.
Scatter Correction for Industrial Cone-Beam Computed Tomography (CBCT)
Download our white paper on Scatter Correction for Industrial Cone-Beam Computed Tomography (CBCT)
Using 3D VSHARP, a fast GPU-Based Linear Boltzmann Transport Equation Solver here: http://bit.ly/2Y0t78P
Research and Application Development For NDT
Acuren’s Research and Application Development specializes in the development of advanced ultraso
nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications.