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	230 views Technical Discussions Natt Natt 01:10 Aug-17-2005 JIS Any one know where can I get JIS standard (piping)    Reply  Translate  Close

Product Spotlight FD800 Bench Top Flaw Detectors StandElcometer NDT The bench-top FD800 flaw detector range combines state-of-the-art flaw detection with advanced mater ... ial thickness capabilities. Designed for use in the laboratory these gauges are the tool you need for all your flaw detecting needs. > 3 Showcases3 Videos FMC/TFM StandAdvanced OEM Solutions Next generation for Phased Array UT is here now with FMC/TFM! Have higher resolution imaging, impr ... oved signal to noise ratio, characterize, size and analyze defects better with access to several wave mode views and save raw FMC data for higher quality analysis.  Some of the benefits are: Beautiful Image! Easier to understand what you're looking at Completely focused in entire image or volume Much easier to define setups before inspection Easier to decipher geometry echoes from real defects Oriented defects (e.g. cracks) are imaged better See image from different wave modes from one FMC inspection FMC data can be reprocessed/analyzed without going back to the field > 3 Showcases MANTIS StandEddyfi Technologies MANTIS is a compact, powerful and affordable flaw detector (16:64PR), dedicated to field operators ... . This portable equipment offers standard (electronic-, sector-, compound scan, conventional UT for pulse-echo, dual array and TOFD inspections), and advanced phased-array (real-time TFM -Total Focusing Method). MANTIS benefits from the same intuitive and user-friendly interface (CAPTURE) than Gekko for easier inspections. > 19 Showcases22 Videos Research and Application Development For NDT StandECLIPSE SCIENTIFIC Acuren’s Research and Application Development specializes in the development of advanced ultraso ... nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications. > 3 Showcases5 Videos more Showcases

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