where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -

Controle Mesure Systemes
Contrôle Mesure Systèmes designs, develops and manufactures nearly 30 years a complete NDT range of products in eddy current and ultrasonic testing methods.

699 views
Technical Discussions
Christian Grosse
Teacher,
Technische Universität München, Germany, Joined Nov 2000, 11

Christian Grosse

Teacher,
Technische Universität München,
Germany,
Joined Nov 2000
11
06:23 Jun-08-1999
The art of discussions

I am writing in response to the comments of Mr. William Streett posted to the NDT forum in the past few weeks, but this contribution is more general so I did not repost it to a certain message. As Rolf Diederichs stated in the introduction to this months forum, if he would "... gave awards for best answers, winners would be Tom Nelligan or Ed Ginzel both are champions! "
I suggest to give the award to Mr. Streett. His answers are always very interesting. For those who did not follow up his contributions, here are some exaples:

To Alex Gibson, 5/21/1999 :
Those engaged in research on impact-echo could benefit from the extensive work done by Professor Sansalone and her colleagues, rather than attempting to reinvent the method.


To Camille Colla, 5/12/1999 :
The article by Colla, et al. is filled with so much misinformation that one hardly knows where to begin ...

Instead of taking the time to learn what is already known ...

They clearly do not understand how the choice of equipment ...

They readily fit the description of unskilled and uninformed operators ...

... has been ignored in the BAM-Berlin article.

To get serious: If someone has arguments against posted articles and think that its contribution to the forum is usefull for others I recomment to stick very close to the scientific details. This is a good tradition in the scientific community and it is even more important in the era of electronic publishing using the internet.
Considering that some of the forum readers with a poor expertise in english (including myself) will not understand the - lets say - enthusiasm of Mr. Streett regarding impact-echo, the scientific content in the sentences citated above is even harder to understand. There is no need to ride a personal attack against somebody else even if there is a dispute in a certain field of application.

Related to the scientific content of Mr. Streett's contributions I want to point out that there is still a lot of work to do in the field of impact-echo techniques. It is undoubtful that not all problems are yet solved especially regarding certain applications. The acceptance of a NDT method is not only influenced by the expertise of the applicators. I am glad about every scientist who is willing to share the results of impact-echo measurements and who gives details about measurement techniques and equipment. Reviewing the research in similar fields in the past it becomes obvious, that a method is developed much faster and more efficient if some different research groups with different equipment are working on theory and applications. Sometimes there are more benefits using own equipment than using the black-box equipment of a comercial manufacturer, but I agree that a company representative may have another opinion ;-)

Sorry, for my lengthy non-scientific contribution - maybe this is the time to come back to research and some concise discussions about it.



    
 
 
Michael Trinidad
Consultant,
LMATS Pty Ltd , Australia, Joined Jan 2003, 138

Michael Trinidad

Consultant,
LMATS Pty Ltd ,
Australia,
Joined Jan 2003
138
01:53 Jun-09-1999
Re: The art of discussions
On the other hand the beauty of this particular site is that participating authors answer posted questions in a pertinent, precise yet they can deliver the information in basic terminology.

Most posts stimulate discussion and discussions provide an invaluable learning tool and I have collected some interesting bits of information which I file away for future reference.

I hope the forum stays the same, a site where questions can be asked by beginners or scientists and anything in between and worded in a fashion all can benefit from.

Kind Regards

Michael Trinidad



    
 
 

Product Spotlight

IntraPhase Athena Phased Array System

The Athena Phased Array system, manufactured by WesDyne NDE Products & Technology, consists of a pha
...
sed array acquisition system and PC running IntraSpect software. A PC is used to perform acquisition, analysis and storage of the data. System hardware is capable of operating up to four data sets with any combination of phased array or conventional UT probes. NOW AVAILABLE IN 64-64 CONFIGURATION.
>

Alpha Pro Digital Radiography System

The Alpha Pro digital X-ray system is the ideal system for your NDT \r\nneeds, as it offers amazin
...
g 16 bit images which enable the highest \r\nlevel of detection and identification of hairline cracks. While weighing only 3kg (6.6lbs), this panel has the largest imaging area: 35 X 43 cm (14X17 in).
>

Varex Imaging Large Field of View (FOV) Digital Detector Arrays (DDAs)

A larger FOV DDA can reduce the space and volume of the X-ray inspection system on the factory floor
...
, enable faster scanning times, better throughput and better resolution images at a lower dose. Customers can also save time and money. With these benefits in mind, Varex Imaging has designed a family of large FOV detectors (4343HE, XRD 1611, 4343DX-I, 4343CT) for our industrial imaging customers.
>

Cygnus 6+ PRO Multi-Mode Ultrasonic Thickness Gauge

The Cygnus 6+ PRO thickness gauge is the most advance gauge within the Cygnus range with key featu
...
res including: comprehensive data logging; A-scan and B-scan display; manual gain control; Bluetooth connectivity; and much more. With its unique dual display and three measuring modes (Multiple-Echo, Echo-Echo and Single-Echo), this surface thickness gauge offers maximum versatility for inspections.
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window
s