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- since 1996 -

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Technical Discussions
Joseph E. Pascente
Engineering
Lixi, Inc., USA, Joined Nov 1998, 39

Joseph E. Pascente

Engineering
Lixi, Inc.,
USA,
Joined Nov 1998
39
07:33 Jun-15-1999
Distributors With Nuclear License

We are seeking a list European and Middle East distributors
who have nuclear license allowing them to accept low level
(less than one curie) sealed source.


    
 
 

Product Spotlight

CIVA 2017 UT Module

CIVA NDE Simulation Software is the world leader of NDT Simulation. The UT simulation Module incl
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udes: - "Beam computation": Beam propagation simulation - "Inspection Simulation": Beam interaction with flaws or specimens The user can simulate a whole inspection process (pulse echo, tandem or TOFD) with a wide range of probes (conventional, Phased- arrays or EMAT), components, and flaws.
>

NDTkit RT

NDTkit RT, TESTIA's Digital Radiography software The NDTkit product line software for X-ray analysi
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s. NDTkit RT is a software benefiting from the Ultis kernel which is dedicated to radiographic image analysis. It offers a set of tools and filtering processes to assist RT operators in finding relevant flaws.
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NEW - TD Focus-ScanRX

The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
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ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
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FMC/TFM

Next generation for Phased Array UT is here now with FMC/TFM! Have higher resolution imaging, impr
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oved signal to noise ratio, characterize, size and analyze defects better with access to several wave mode views and save raw FMC data for higher quality analysis.  Some of the benefits are:
  • Beautiful Image! Easier to understand what you're looking at
  • Completely focused in entire image or volume
  • Much easier to define setups before inspection
  • Easier to decipher geometry echoes from real defects
  • Oriented defects (e.g. cracks) are imaged better
  • See image from different wave modes from one FMC inspection
  • FMC data can be reprocessed/analyzed without going back to the field
>

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