where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
230 views
Technical Discussions
tushar
tushar
00:00 May-02-2006
DICONDE image

Does anyone have a DICONDE image sample? Can you please email it to me on cdviewer@gmail.com

thank you


 
 Reply 
 

Product Spotlight

AMIGO2

TSC Amigo2 - ACFM technology has developed a solid reputation for accurately detecting and sizing
...
surface-breaking cracks through paint and coatings. As the industry demands increased performance in speed, signal quality, and portability, it’s time for an evolution. It’s time for Amigo2.
>

HARDNESS TESTER TKM-459CE combi

TKM-459CE combi applies 2 methods of hardness control: UCI and Leeb. It provides high-accuracy tes
...
ting of metals and alloys as well as items of different sizes and configurations, their hardened layers and galvanic coatings. Device represents results in HB, HRC, HV and others. Shock-, dust- and water-proof housing with intuitive software make this gauge easy to use in all working conditions.
>

PROlineTOP Plug & Play Ultrasonic inspection device

As Plug & Play solution it units all control and operation elements in a small housing and therefo
...
re replaces the typical control cabinet...
>

YXLON Cougar EVO

Scalable small footprint X-ray inspection systems for assembly and laboratory applications. The
...
YXLON Cougar EVO series was designed to provide the "best-in- class" inspection solutions for SMT, semiconductor, and laboratory assembly applications, while maintaining a small system footprint for maximum convenience. With optimized software and hardware, these systems produce higher quality and more consistent results than other electronics inspection systems currently on the market.
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window