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where expertise comes together
- since 1996 -

YXLON International GmbH
YXLON International - innovative High-Tech-Company with long traditionYXLON International develops, manufactures and markets digital radios ...
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Jiang Hua Wu

Jiang Hua Wu -
22. Apr

and K.P. Sarvan are now colleagues

Jiang Hua Wu -
8. Oct

Safety Instructions for leeb hardness tester
The instrument can only work with the specially designed battery pack and power adapter (charger) supplied by Mitech Co. LTD. Working with others may result in damage of the instrument, battery leakage, fire or even explosion.
Do not cast the battery pack into fire and do not short circuit, disassemble or heat the battery pack, otherwise battery leakage, fire or even explosion may occur.
Do not open the cover of the paper compartment or come into contact with the heating head of the printer by hand or any part of your body to avoid burns due to high temperature when the printer is printing.

Jiang Hua Wu -
29. Sep

JSLD-4 type of Choloride penetration tester comply with U.S. ASTM C1202, Harbor JTJ275-2000 resistance
to chloride ion penetration of concrete standards and railway construction [2005] No. 160 standards, It is widely
used for marine, bridges, tunnels, dams and civil projects such as the durability of various concrete design,
production quality control and acceptance of work.
Products embedded with computer control. LCD screen display, 40M high-speed CPU, high-speed FLASH
memory, and high-precision 16-bit high-precision op amp and AD converter. Also it has very high anti-jamming
performance, equipment with data storage when power failure and power-down.
PBC button, English menu display, the system with own time. Operation menu with password privileges
protection to prevent misuse and ensure testing process safe and reliable. Real-time automatic data conversion,
testing completed results are automatically displayed.
Standard RS232 serial communication, can be connected to the host computer, export the test data and generate
EXCEL reports, together with curve analysis, print and archive.
Host with six-channel output, the standard DC plug and connection, the use of hot forming one, reduce
disconnection fault caused by frequently use, the positive and negative connection joint, the former one is long, the
other one is short, to avoid short circuit occurs when hot insert and plug. Both short-circuit and overload protection
to ensure test safe and reliable.

Jiang Hua Wu -
28. Sep

how to Calibrate with Dual-Element (TR) Probes
Dual-element (TR) probes are especially used for wall thickness measurement.
The following peculiarities must be taken into account when using these probes:
Echo Flank. Most dual-element (TR) probes have a roof angle (transducer
elements with inclined orientation toward the test surface). This causes mode
conversions both at beam index (sound entry into the material) and at the
reflection from the backwall, which can result in very jagged echoes.
V-Path Error. Dual-element (TR) probes produce a v-shaped sound path from
the pulser via the reflection from the backwall to the receiver element. This
so-called “V-path error” affects the measuring accuracy. You should therefore
choose two wall thicknesses that cover the expected thickness measurement
range for the calibration. In this way, the V-path error can be corrected to the
greatest possible extend.
Higher Material Velocity. Due to the V-path error, a higher material velocity
than that of the test material is given during calibration, especially with small
thicknesses. This is typical of dual-element (TR) probes and serves for
compensation of V-path error.
With small wall thicknesses, the above-described effect leads to an echo
amplitude drop which has to be especially taken into account with thicknesses
less than 2 mm.
A stepped reference block having different wall thicknesses is required for
calibration. The wall thicknesses must be selected so that they cover the
expected readings.
Calibration Process
We recommend to use the semiautomatic calibration function for the calibration
with T/R probes.
- Set the required test RANGE
- Increase the probe delay until the two calibration echoes selected are
displayed within the range
- Set the pulser and receiver functions according to the probe used and
the test application.
- Select the function group PDELAY.
- Enter the distances of the two calibration echoes in S-REF1 and
- Position one gate on the first calibration echo.
- Position the other gate on the second calibration echo.
- Press the knob while selecting the function CAL to trigger the calibration.
The correct calibration is confirmed by the message “Calibration is finished”.
The instrument will now automatically determine the sound velocity and the
probe delay and set the corresponding functions accordingly. The value of the
function P-DELAY will be set to the correct value.
If necessary, check the calibration on one or several known calibration lines, e.g.
using the stepped reference block.

Jiang Hua Wu -
28. Sep

and Eko Rezky are now colleagues

Jiang Hua Wu -
26. Sep

 Semiautomatic two point calibration: Automated calibration of transducer
zero offset and/or material velocity
 Flaw Locating:Live display Sound-path, Projection (surface distance),
Depth, Amplitude,
 Flaw sizing: Automatic flaw sizing using AVG/AVG or DAC, speeds reporting
of defect acceptance or rejection.
 Digital Readout and Trig. Function: Thickness/Depth can be displayed in
digital readout when using a normal probe and Peam path, Surface
Distance and Depth are directly displayed when angle probe is in use.
 Both the DAC and the AVG method of amplitude evaluation are available.
 Curved Surface Correction feature
 Crack Height Measure function
 Weld figure feature
 Magnify gate:spreading of the gate range over the entire screen width
 Video Recording and play
 Auto-gain function
 Envelope: Simultaneous display of live A-scan at 60 Hz update rate and
envelope of A-scan display
 Peak Hold: Compare frozen peak waveforms to live A-Scans to easily
interpret test results.
 A Scan Freeze:Display freeze holds waveform and sound path data
 B Scan display feature

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