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138 Authors of AeroNDT 2013
Author▲ Institution▲ City▲ Country▲ Location▲
Ageeva, Victoria University of Nottingham,
School of Electrical and Electronic Engineering
NottinghamUnited Kingdom
Nottingham
Allard, Pierre-Hugues CREAFORM Lévis, QuébecCanada
Lévis, Québec
Allgaier, Michael MISTRAS Products & Systems Princeton Junction, NJUSA
Princeton Junction, NJ
Aveson, John W University of Cambridge,
Department of Materials Science and Metallurgy
CambridgeUnited Kingdom
Cambridge
Babcock, Paul Arc of Virginia Peninsula Hampton, VAUSA
Hampton, VA
Baker, Robert J Alcoa-Howmet Whitehall, MIUSA
Whitehall, MI
Berthe, Laurent ParisTech,
PIMM, CNRS-ENSAM
ParisFrance
Paris
Böhnel, Michael Fraunhofer Institute for Integrated Circuits (IIS) FürthGermany
Fürth
Boustie, Michel Institut PPRIME,
Institut Pprime, CNRS-ENSMA-Département Physique et Mécanique
Futuroscope ChasseneuilFrance
Futuroscope Chasseneuil
Burtzlaff, Susanne Fraunhofer Development Center for X-ray Technology EZRT WürzburgGermany
Würzburg
Campagne, Benjamin EADS CCR,
Industrial Materials Institute
Suresnes France
Suresnes
Cañada, Mar Universidad Politecnica de Valencia,
Instituto de Ingeniería Energética
GandiaSpain
Gandia
Carlos, Mark F. MISTRAS Products & Systems Princeton Junction, NJUSA
Princeton Junction, NJ
Castaings, Michel University Bordeaux,
I2M
TalenceFrance
Talence
Chui, Kui Ming Image Enhancement Technology Ltd UxbridgeUnited Kingdom
Uxbridge
Chui, Shyr University Hospital of Northern British Columbia (UNBC) Prince George, BCCanada
Prince George, BC
Clark, Matt University of Nottingham,
School of Electrical and Electronic Engineering
NottinghamUnited Kingdom
Nottingham
Cooper, Ian TWI Ltd (The Welding Institute) Great Abington, CambridgeUnited Kingdom
Great Abington, Cambridge
Coulson, Jethro University of Nottingham,
Applied Optics Group, School Electrical and Electronic Engineering
NottinghamUnited Kingdom
Nottingham
Cuevas Aguado, Esmeralda Tecnatom S.A. MadridSpain
Madrid
Di Xiang, Cheng National University of Defense technology ChangshaChina
Changsha
Dierig, Tobias Volume Graphics GmbH HeidelbergGermany
Heidelberg
Dominguez, Nicolas European Aeronautic Defense and Space Company (EADS) ,
Innovation Works Dep. (IW)
ToulouseFrance
Toulouse
Donahue, Jeff MISTRAS Products & Systems Princeton Junction, NJUSA
Princeton Junction, NJ
Dunhill, Tony K. Rolls-Royce plc BristolUnited Kingdom
Bristol
Dutta, Somen Deutsches Zentrum für Luft- und Raumfahrt (DLR), German Aerospace Center,
somen.dutta@dlr.de
AugsburgGermany
Augsburg
Ecault, Romain Institut PPRIME,
Institut Pprime, CNRS-ENSMA-Département Physique et Mécanique
Futuroscope ChasseneuilFrance
Futuroscope Chasseneuil
Ehrhart, Bastien Fraunhofer-Institute for Non-Destructive Testing (IZFP) SaarbrückenGermany
Saarbrücken
Ennen, Alexander Fraunhofer Institute for Integrated Circuits (IIS),
Development Center X-ray technology (EZRT)
FürthGermany
Fürth
Ermann, Gerald Fraunhofer Institute for Integrated Circuits (IIS) FürthGermany
Fürth
Fan, David Zheng Nanyang Technical University,
School of Mechanical and Aerospace Engineering
SingaporeSingapore
Singapore
Fernandez-Lopez, Antonio Technical University of Madrid (UPM) ,
Dpt Aeronautics
MadridSpain
Madrid
Fraser, Jean-Simon CREAFORM Lévis, QuébecCanada
Lévis, Québec
Froome, Paul University College London (UCL) ,
Department of Mechanical Engineering
LondonUnited Kingdom
London
García Ramos, Covadonga Tecnatom S.A. MadridSpain
Madrid
Genest, Marc National Research Council Canada (NRC),
Institute for Aerospace Research
Ottawa, OntarioCanada
Ottawa, Ontario
Georgeson, Gary Boeing Research and Technology Seattle, WAUSA
Seattle, WA
Gilliland, Bradley GE Inspection Technologies Lewistown, PAUSA
Lewistown, PA
Gnaas, Matthias TUIfly GmbH LangenhagenGermany
Langenhagen
Godinez-Azcuaga, Valery MISTRAS Products & Systems Princeton Junction, NJUSA
Princeton Junction, NJ
Goh, Lay Siong Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Gomez, Tomás Spanish National Research Council (CSIC),
Sensors and Ultrasonic Technologies Dept. ISI
MadridSpain
Madrid
Güemes, Alfredo Technical University of Madrid (UPM) ,
Dpt Aeronautics
MadridSpain
Madrid
Guenther, Thomas Volume Graphics GmbH HeidelbergGermany
Heidelberg
Hallett, Stephen R. University of Bristol,
Faculty of Engineering
BristolUnited Kingdom
Bristol
Hanke, Randolf Julius-Maximilians-University Würzburg,
Faculty for Physics and Astronomy
WürzburgGermany
Würzburg
Hernandez, Sergio Tecnatom S.A. MadridSpain
Madrid
Hernandez-Crespo, Borja Technical University of Madrid (UPM) ,
Dpt Aeronautics
MadridSpain
Madrid
Hinken, Johann H FI Test- und Messtechnik GmbH MagdeburgGermany
Magdeburg
Huang, Ruoxuan Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Hübner, Stefanie Fraunhofer Institute for Integrated Circuits (IIS),
Development Center X-ray technology (EZRT)
FürthGermany
Fürth
Ji, Li National University of Defense technology ChangshaChina
Changsha
Jian Qiang, Zhao National University of Defense technology ChangshaChina
Changsha
Kaestner, Anders P. Paul Scherrer Institute,
Neutron Imaging and Activation Group
VilligenSwitzerland
Villigen
Kakarala, Ramakrishna Nanyang Technical University,
School of Computer Engineering
SingaporeSingapore
Singapore
Kaliamoorthi, Prabhu Nanyang Technical University,
School of Computer Engineering
SingaporeSingapore
Singapore
Khan, Muzibur National Research Council Canada (NRC),
Structures and Materials Performance Laboratory, Institute for Aerospace Research
Ottawa, OntarioCanada
Ottawa, Ontario
Krebber, Katerina BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Laplante, Gabriel University of Moncton Moncton, New BrunswickCanada
Moncton, New Brunswick
Lavoie, Jérôme-Alexandre CREAFORM Lévis, QuébecCanada
Lévis, Québec
Lawrie, Andrew University of Bristol,
Faculty of Engineering
BristolUnited Kingdom
Bristol
Lehmann, Eberhard H. Paul Scherrer Institute,
Neutron Imaging and Activation Group
VilligenSwitzerland
Villigen
Ley, Obdulia MISTRAS Products & Systems Princeton Junction, NJUSA
Princeton Junction, NJ
Li, Peifeng Nanyang Technical University SingaporeSingapore
Singapore
Li, Wenqi University of Nottingham,
School of Electrical and Electronic Engineering
NottinghamUnited Kingdom
Nottingham
Liaptsis, Dimos TWI Ltd (The Welding Institute) Great Abington, CambridgeUnited Kingdom
Great Abington, Cambridge
Liew, Seaw Jia Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Lifton, Joseph J. Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Lim, Seng Hoo Cairnhill Metrology Jalan Kilang BaratSingapore
Jalan Kilang Barat
Lin, Wei Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Liu, Tong Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Liu, Zhe Nanyang Technical University,
School of Mechanical and Aerospace Engineering
SingaporeSingapore
Singapore
Loison, Didier Institut PPRIME Futuroscope ChasseneuilFrance
Futuroscope Chasseneuil
Lowe, Michael Imperial College London,
UK Research Centre in NDE
LondonUnited Kingdom
London
Maier, Dennis Volume Graphics GmbH HeidelbergGermany
Heidelberg
Malcolm, Andrew Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Malinowski, Pawel Henryk Polish Academy of Sciences,
Institute of Fluid–-Flow Machinery
KrakowPoland
Krakow
Martinez, Marcias National Research Council Canada (NRC),
Structures and Materials Performance Laboratory, Institute for Aerospace Research
Ottawa, OntarioCanada
Ottawa, Ontario
Maslouhi, Ahmed University of Sherbrooke,
Department of Mechanical Engineering
SherbrookeCanada
Sherbrooke
McBride, John W. University of Southampton SouthamptonUnited Kingdom
Southampton
Mckessy, William Alcoa-Howmet Whitehall, MIUSA
Whitehall, MI
Mineo, Carmelo University of Strathclyde,
Department of Electronic and Electrical Engineering
Glasgow, ScotlandUnited Kingdom
Glasgow, Scotland
Mrad, Nezih Defence R&D Canada (DRDC),
Air Vehicles Research Section
Ottawa, ONCanada
Ottawa, ON
Mukhopadhya, Supratik University of Bristol,
Faculty of Engineering
BristolUnited Kingdom
Bristol
Mukund, Vanditha NanoArk Corporation Fairport, NYUSA
Fairport, NY
Netzelmann, Udo Fraunhofer-Institute for Non-Destructive Testing (IZFP) SaarbrückenGermany
Saarbrücken
Nezadal, Martin University of Erlangen-Nürnberg (FAU),
Graduate School of Advanced Optical Technologies,
ErlangenGermany
Erlangen
Ng, Ivan Kee Beng Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Nicholson, Ian TWI Ltd (The Welding Institute) Great Abington, CambridgeUnited Kingdom
Great Abington, Cambridge
Ostachowicz, Wieslaw Mieczyslaw Polish Academy of Sciences (PAS),
Institute of Fluid–-Flow Machinery
GdanskPoland
Gdansk
Pasupuleti, Ajay NanoArk Corporation Fairport, NYUSA
Fairport, NY
Phang, Albert Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Pouliquen, Clément University of Sherbrooke,
Department of Mechanical Engineering
SherbrookeCanada
Sherbrooke
Premachandran, Vittal Nanyang Technical University,
School of Computer Engineering
SingaporeSingapore
Singapore
Reims, Nils Fraunhofer Institute for Integrated Circuits (IIS),
Development Center X-ray technology (EZRT)
FürthGermany
Fürth
Reinhart, Christof Volume Graphics GmbH HeidelbergGermany
Heidelberg
Reisinger, Stefan Fraunhofer Institute for Integrated Circuits (IIS) FürthGermany
Fürth
Reverdy, Frederic Commissariat Energie Atomique (CEA),
LIST
Gif-Sur-YvetteFrance
Gif-Sur-Yvette
Rocha, Bruno University of Victoria Victoria, BCCanada
Victoria, BC
Salamon, Michael Fraunhofer Institute for Integrated Circuits (IIS),
Development Center X-ray technology (EZRT)
FürthGermany
Fürth
Schilder, Constanze BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Schmidt, Lorenz-Peter University of Erlangen-Nürnberg (FAU),
Institute of Microwaves and Photonics
ErlangenGermany
Erlangen
Schmidt, Thomas Deutsches Zentrum für Luft- und Raumfahrt (DLR), German Aerospace Center,
Institute of Structures and Design
AugsburgGermany
Augsburg
Schmitt, Michael Fraunhofer Institute for Integrated Circuits (IIS),
Development Center X-ray technology (EZRT)
FürthGermany
Fürth
Schukar, Marcus BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Schür, Jan University of Erlangen-Nürnberg (FAU),
Institute of Microwaves and Photonics
ErlangenGermany
Erlangen
Sharples, Steve D. University of Nottingham,
Applied Optics Group, School Electrical and Electronic Engineering
NottinghamUnited Kingdom
Nottingham
Silversides, Ian University of Sherbrooke SherbrookeCanada
Sherbrooke
Smith, Richard J University of Nottingham,
Applied Optics Group, School Electrical and Electronic Engineering
NottinghamUnited Kingdom
Nottingham
Smith, Robert A University of Bristol,
Faculty of Engineering
BristolUnited Kingdom
Bristol
Somekh, Mike G. University of Nottingham,
Applied Optics Group, School Electrical and Electronic Engineering
NottinghamUnited Kingdom
Nottingham
Spence, John NanoArk Corporation Fairport, NYUSA
Fairport, NY
Stanfield, David Image Enhancement Technology Ltd UxbridgeUnited Kingdom
Uxbridge
Steffen, Milan BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Stratoudaki, Theodosia University of Nottingham,
School of Electrical and Electronic Engineering
NottinghamUnited Kingdom
Nottingham
Tan, Xianglin Wuhan Mechanical College WuhanChina
Wuhan
Telesz, Shana GE Inspection Technologies Lewistown, PAUSA
Lewistown, PA
Teng, Wei Yuen Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Touchard, Fabienne Institut PPRIME,
Institut Pprime, CNRS-ENSMA-Département Physique et Mécanique
Futuroscope ChasseneuilFrance
Futuroscope Chasseneuil
Uhlmann, Norman Fraunhofer Institute for Integrated Circuits (IIS),
Development Center X-ray technology (EZRT)
FürthGermany
Fürth
Valeske, Bernd Fraunhofer-Institute for Non-Destructive Testing (IZFP) SaarbrückenGermany
Saarbrücken
Vanu, Joshua K ST Aerospace Engineering Pte Ltd,
NDT
Paya LebarSingapore
Paya Lebar
Venegas, Pablo Aeronautical Technology Centre (CTA) MinanoSpain
Minano
Voillaume, Hubert EADS CCR,
Non Destructive Investigations & Structural Health Monitoring
Suresnes France
Suresnes
Voland, Virginia Fraunhofer Institute for Integrated Circuits (IIS),
Development Center X-ray technology (EZRT)
FürthGermany
Fürth
Walle, Günter Fraunhofer-Institute for Non-Destructive Testing (IZFP) SaarbrückenGermany
Saarbrücken
Wang, Qing Nanyang Technical University,
School of Mechanical and Aerospace Engineering
SingaporeSingapore
Singapore
Wong, Lye Seng Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Wride, Andrew Image Enhancement Technology Ltd UxbridgeUnited Kingdom
Uxbridge
Wright, Ben TWI Ltd (The Welding Institute) Great Abington, CambridgeUnited Kingdom
Great Abington, Cambridge
Xu, J. Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Xu, Jian Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Yan, Dawei TWI Ltd (The Welding Institute) Great Abington, CambridgeUnited Kingdom
Great Abington, Cambridge
Yanishevsky, Marko National Research Council Canada (NRC),
Structures and Materials Performance Laboratory, Institute for Aerospace Research
Ottawa, OntarioCanada
Ottawa, Ontario
Yin, Xiaoming Singapore Institute of Manufacturing Technology (SIMTech) SingaporeSingapore
Singapore
Ying, Tang National University of Defense technology ChangshaChina
Changsha
Yun Ze, He National University of Defense technology ChangshaChina
Changsha
Zhang, Shu-Yan Science and Technology Facilities Council,
Rutherford Appleton Laboratory
DidcotUnited Kingdom
Didcot

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