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- since 1996 -

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TOP 100 Authors
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TOP 100 Authors
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Authors are Members

Top 100 Authors
AuthorInstitutionCityCountryLocationLocation
Ewert, Uwe BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Kreutzbruck, Marc University of Giessen GießenGermany
Gießen
Kastner, Johann Upper Austrian University of Applied Sciences (FH OÖ) WelsAustria
Wels
Balasubramaniam, Krishnan Indian Institute of Technology Madras (IITM),
Centre for Non Destructive Evaluation and Department of Mechanical Engineering
ChennaiIndia
Chennai
Grosse, Christian U. University of Stuttgart,
Institute of Construction Materials
Stuttgart Germany
Stuttgart
Zscherpel, Uwe BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Maierhofer, Christiane BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Ginzel, Edward Materials Research Institute WaterlooCanada
Waterloo
Spies, Martin Fraunhofer-Institute for Non-Destructive Testing (IZFP) SaarbrückenGermany
Saarbrücken
Müller, Christina BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Maldague, Xavier Laval University,
Electrical and Computing Eng
Quebec City, QuebecCanada
Quebec City, Quebec
Boller, Christian Fraunhofer-Institute for Non-Destructive Testing (IZFP) SaarbrückenGermany
Saarbrücken
Schubert, Frank Fraunhofer Institute for Ceramic Technology and System (IKTS),
Branch Lab Dresden
DresdenGermany
Dresden
Grum, Janez University of Ljubljana,
Faculty of Mechanical Engineering
LjubljanaSlovenia
Ljubljana
Busse, Gerhard University of Stuttgart,
Institute for Polymer Testing and Polymer Science (IKP)
Stuttgart Germany
Stuttgart
Hentschel, Manfred P. BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Hillger, Wolfgang Hillger Ing. Büro BraunschweigGermany
Braunschweig
Lange, Axel BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Wiggenhauser, Herbert BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Převorovský, Zdeněk Czech Academy of Sciences (CAS),
Institute of Thermomechanics
PragueCzech Republic
Prague
Boehm, Rainer BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Rieder, Hans Fraunhofer-Institute for Non-Destructive Testing (IZFP) SaarbrückenGermany
Saarbrücken
Savin, Adriana National Institute of R&D for Technical Physics,
Nondestructive Testing Department
IasiRomania
Iasi
Deutsch, Wolfram A. Karl Karl Deutsch Pruef- und Messgeraetebau WuppertalGermany
Wuppertal
Redmer, Bernhard BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Krause, Martin BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Pitkänen, Jorma VTT Technical Research Centre of Finland EspooFinland
Espoo
Mook, Gerhard University of Magdeburg (OVGU),
Institut für Werkstofftechnik und -prüfung
MagdeburgGermany
Magdeburg
Kažys, Rymantas Ultrasound Institute at Kaunas University of Technology KaunasLithuania
Kaunas
Diederichs, Rolf NDT.net Bad BreisigGermany
Bad Breisig
Mazal, Pavel Brno University of Technology (BUT),
Faculty of Mechanical Engineering
BrnoCzech Republic
Brno
Wevers, Martine Catholic University of Leuven (KU Leuven) ,
Department of Metallurgy and Materials Engineering
LeuvenBelgium
Leuven
Goebbels, Jürgen BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Steigmann, Rozina National Institute of R&D for Technical Physics,
Nondestructive Testing
IasiRomania
Iasi
Hinken, Johann H FI Test- und Messtechnik GmbH MagdeburgGermany
Magdeburg
Mažeika, Liudas Ultrasound Institute at Kaunas University of Technology KaunasLithuania
Kaunas
Heckel, Thomas BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Ciorau, Peter Ontario Power Generation Inc.(OPG) PickeringCanada
Pickering
Taffe, Alexander BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Grimberg, Raimond National Institute of R&D for Technical Physics,
Nondestructive Testing Department
IasiRomania
Iasi
Köhler, Bernd Fraunhofer-Institute for Non-Destructive Testing (IZFP) SaarbrückenGermany
Saarbrücken
Dobmann, Gerd Fraunhofer-Institute for Non-Destructive Testing (IZFP) SaarbrückenGermany
Saarbrücken
Moles †2014, Michael Olympus Scientific Solutions Americas (OSSA) Waltham, MAUSA
Waltham, MA
Kurz, Jochen H. University of Stuttgart Stuttgart Germany
Stuttgart
Bellon, Carsten BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Osterloh, Kurt BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Vogt, Göran VOGT Ultrasonics GmbH BurgwedelGermany
Burgwedel
Brekow, Gerhard BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Ibarra-Castanedo, Clemente Laval University,
Electrical and Computing Eng
Quebec City, QuebecCanada
Quebec City, Quebec
Solodov, Igor University of Stuttgart,
Institute for Polymer Testing and Polymer Science (IKP)
Stuttgart Germany
Stuttgart
Plank, Bernhard FH OOE Forschungs und Entwicklungs GmbH WelsAustria
Wels
Müller, Bernd R. BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Pazder, Luboš Brno University of Technology (BUT),
Faculty of Civil Engineering, Department of Physics
BrnoCzech Republic
Brno
Kupsch, Andreas BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Gorkunov, Edward S. Russian Academy of Sciences, RAS, Ural Branch ,
Institute of Engineering Science
EkaterinburgRussia
Ekaterinburg
Niederleithinger, Ernst BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Ostachowicz, Wieslaw M. Polish Academy of Sciences,
Institute of Fluid–-Flow Machinery
KrakowPoland
Krakow
Hasenstab, Andreas BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Kořenská, Marta Brno University of Technology (BUT),
Faculty of Civil Engineering, Department of Physics
BrnoCzech Republic
Brno
Gaal, Mate BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Erhard, Anton BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Hassler, Ulf Fraunhofer Institute for Integrated Circuits (IIS),
Development Center X-ray technology (EZRT)
FürthGermany
Fürth
Krause, Thomas W. Royal Military College of Canada (RMC),
Department of Physics
Kingston, OntarioCanada
Kingston, Ontario
Dubov, Anatolii A. E.O. Paton Electric Welding Institute, NASU KievUkraine
Kiev
Röllig, Mathias BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Reimche, Wilfried Leibniz Universität Hannover ,
Institut für Werkstoffkunde
HannoverGermany
Hannover
Schickert, Martin Bauhaus-Universität Weimar,
Materialforschungs- und -prüfanstalt (MFPA)
WeimarGermany
Weimar
Vallen, Hartmut Vallen-Systeme GmbH IckingGermany
Icking
Sause, Markus G.R. University of Augsburg,
Institute for Physics, Experimentalphysik II
AugsburgGermany
Augsburg
Kasperl, Stefan Fraunhofer Institute for Integrated Circuits (IIS),
Development Center X-ray technology (EZRT)
FürthGermany
Fürth
Ronneteg, Ulf Swedish Nuclear Fuel and Waste Management Co (SKB),
Canister Laboratory
OskarshamnSweden
Oskarshamn
Netzelmann, Udo Fraunhofer-Institute for Non-Destructive Testing (IZFP) SaarbrückenGermany
Saarbrücken
Heinzl, Christoph Upper Austrian University of Applied Sciences (FH OÖ) WelsAustria
Wels
Tscheliesnig, Peter TÜV Austria Services GmbH ViennaAustria
Vienna
Kröning, Michael Fraunhofer-Institute for Non-Destructive Testing (IZFP) SaarbrückenGermany
Saarbrücken
Heuer, Henning Fraunhofer Institute for Ceramic Technology and System (IKTS) DresdenGermany
Dresden
Salaberger, Dietmar Upper Austrian University of Applied Sciences (FH OÖ) WelsAustria
Wels
Thomas, Hans-Martin Swiss Federal Laboratories for Materials Testing and Research (EMPA) DübendorfSwitzerland
Dübendorf
Meyendorf, Norbert University of Dayton Research Institute,
Center for Materials Diagnostics
Dayton, OHUSA
Dayton, OH
Brackrock, Daniel BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Raisutis, Renaldas Ultrasound Institute at Kaunas University of Technology KaunasLithuania
Kaunas
Ono, Kanji Aoyama Gakuin University Sagamihara, KanagawaJapan
Sagamihara, Kanagawa
Jaenisch, Gerd-Rüdiger BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Cawley, Peter Imperial College London,
UK Research Centre in Non-destructive Evaluation (RCNDE), Department of Mechanical Engineering
LondonUnited Kingdom
London
Sollier, Thierry Commissariat Energie Atomique (CEA) Gif-Sur-YvetteFrance
Gif-Sur-Yvette
Bertovic, Marija BAM Federal Institute for Materials Research and Testing BerlinGermany
Berlin
Goldammer, Matthias Siemens AG, Corporate Technology (CT),
Corporate Technology
MunichGermany
Munich
Walaszek, Henri French Industrial and Mechanical Technical Centre (CETIM) SenlisFrance
Senlis
Nardoni, Giuseppe I&T Nardoni Institute BresciaItaly
Brescia
Bavendiek, Klaus YXLON International GmbH HamburgGermany
Hamburg
Rajagopal, Prabhu Indian Institute of Technology Madras (IITM) ChennaiIndia
Chennai
Carboni, Michele Politecnico di Milano,
Department of Mechanical Engineering
MilanoItaly
Milano
Mahaut, Steve Commissariat Energie Atomique (CEA) Gif-Sur-YvetteFrance
Gif-Sur-Yvette
Hintze, Hartmut DB Systemtechnik GmbH KirchmöserGermany
Kirchmöser
Szielasko, Klaus Fraunhofer-Institute for Non-Destructive Testing (IZFP) SaarbrückenGermany
Saarbrücken
Bison, Paolo G. National Research Council, Construction Technologies Institute (ITC-CNR) PadovaItaly
Padova
Chassignole, Bertrand Electricité de France (EDF) ,
Département MMC
Moret-sur-LoingFrance
Moret-sur-Loing
Reboud, Christophe Commissariat Energie Atomique (CEA) Gif-Sur-YvetteFrance
Gif-Sur-Yvette
Falter, Stephan GE Inspection Technologies GmbH HürthGermany
Hürth
Takemoto, Mikio Aoyama Gakuin University Sagamihara, KanagawaJapan
Sagamihara, Kanagawa

Actual Cooperations

Product Spotlight

HD-CR 35 NDT Computed Radiography System

Portable high-resolution CR scanner for all radiography applications - weld testing, profile images
...
and aerospace. No matter what type of radiographic testing you are performing, the unique TreFoc Technology of the HD-CR 35 NDT imaging plate scanner always guarantees the highest image quality.
>

TOPAZ® 64: Fully Integrated Portable 64 Channel PAUT Instrument with FMC & TFM

Introducing TOPAZ64, the industry’s most intelligent fully integrated, portable 64-channel phased
...
array ultrasound (UT) instrument. TOPAZ64 combines code-compliant phased array UT with the industry’s most advanced full matrix capture (FMC) and total focusing method (TFM) capabilities. Featuring the highest acquisition frequency in its class, high resolution FMC and a 12” multi-touchscreen, users can easily visualize even the smallest flaws. TOPAZ64 can generate a bipolar pulse that provides more acoustic energy versus previous models for punching through thick components. The result is a portable tool that delivers increased inspection coverage, more accurate signals, and the ability to handle all UT inspections in one package. TOPAZ64 is ideal for challenging applications in transportation, oil and gas, manufacturing and power generation.
>

EKOSCAN Phased Array

In order to always fit your needs, EKOSCAN can manufacture any type of UT transducer, either convent
...
ional or Phased Array. As an ISO 9001: 2015 certified company, EKOSCAN is extremely careful as far a material selection and manufacturing processes are concerned. Our probes guarantee our customers the benefits of latest innovations regarding piezo-composite, backing, impedance adaptation layer, etc. Specific probes for hostile environment: high temperature, high pressure, corrosive environment,etc. Specific probes designed to fit your specific application: optimization of every parameter to guarantee you the best detection.
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Robotic laser shearography enables 100% inspection of complex, flight-critical composite structures

An article in “Composites World Magazine” showcases Non Destructive Testing of aero-structures
...
with Laser Shearography. Over the years Dantec Dynamics has supplied many solutions for the aerospace industry. Referring to specific customer projects several of these cases are examined to outline the advantages of using Laser Shearography for automated defect detection.
>

Compact NDT inspection-heads for measurements with active thermography

The compact inspection head is suitable for thermographic ndt tasks. The uncooled infrared camera
...
is specially developed for NDI-tasks and offers a thermal sensitivity until now known only from thermal imagers with cooled detector. All required components and functions are integrated into the inspection-head. You will only need an ethernet cable to connect the sensor with the evaluation system.
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