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Search Results: 6
Title / Author(s) / Keywords Publication Date
High-precision source location of AE event using automatic error correction of signal rising time
K. Ito6, M. Enoki17
Department of Materials Engineering; University of Tokyo56, Tokyo [Japan]

 
Journal-AE
Session: Volume 34, 2016
2017-10
High Sensitivity Detection of AE Events in Noisy Environment using Stream Recording and Parallel Computation
K. Ito6, M. Enoki17
Department of Materials Engineering; University of Tokyo56, Tokyo [Japan]
Signal Processing, Continuous Waveform, Noise Filtering, Multiple Thresholds, Parallel Computing

 
EWGAE 2016
Session: Devices, Sensors and Transducers
2016-11
Non-destructive Evaluation of Stress Corrosion Cracking under Micro Cell by Acoustic Emission and Video Microscope
M. Shiwa12, H. Masuda1, H. Yamawaki13, K. Ito26, M. Enoki217
1National Institute for Materials Science (NIMS)6, Tsukuba [Japan]
2Department of Materials Engineering; University of Tokyo56, Tokyo [Japan]
Corrosion Detection

 
WCNDT 2016
Session: Corrosion Detection
2016-07
Damage Evaluation by Frequency Analysis of Continuous Recorded AE Waveform
K. Ito6, M. Enoki17
Department of Materials Engineering; University of Tokyo56, Tokyo [Japan]
Acoustic Emission (AE), Short-time Fourier transform, Continuous waveform memory, Alumina fiber mat, Cyclic compression
 
Journal-AE
Session: Volume 24, 2006
2012-11
Real-Time Denoising of AE Signals by Short Time Fourier Transform and Wavelet Transform
K. Ito6, M. Enoki17
Department of Materials Engineering; University of Tokyo56, Tokyo [Japan]
Acoustic Emission (AE), Wavelet transform, Short-time Fourier transform, Noise reduction, Continuous waveform recording
 
Journal-AE
Session: Volume 25, 2007
2012-11
AE Event Detection under Noisy Environment with Continuous Waveform Recording and Multiple Thresholds
K. Ito16, H. Kuriki1, S. Kuroda2, M. Enoki1,217
1Department of Materials Engineering; University of Tokyo56, Tokyo [Japan]
2National Institute for Materials Science (NIMS)6, Tsukuba [Japan]
signal processing, Acoustic Emission (AE), Continuous Waveform, Multiple Thresholds, Plasma Spraying

 
EWGAE 2012
Session: AE Signal Processing and Source Location (2)
2012-11
   
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