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Keyword: X-ray microscopy,
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Title / Author(s) / Keywords PublicationDate
2020-02 iCT 2020 Non-Destructive Testing
Wed 13:40 Room 1
Correlative Tomography – Combining x-ray nanotomography and FIB/SEM serial sectioning to analyze Al-Si cast alloys
M. Engstler14, J. Fell1, M. Maisl223, H. Herrmann216, F. Mücklich14
1Functional Materials; Saarland University81, Saarbrücken, Germany
2Fraunhofer-Institute for Non-Destructive Testing (IZFP)476, Saarbrücken, Germany
correlative tomography, x-ray microscopy, x-ray nanotomography, FIB/SEM serial sectioning, AlSi cast alloys

iCT 2020
Session: Non-Destructive Testing
Wed 13:40 Room 1
2014-03 NDT Review Materials (MDPI)
In-Line Phase-Contrast X-ray Imaging and Tomography for Materials Science
S. Mayo, A. Stevenson, S. Wilkins
CSIRO Materials Science and Engineering, Clayton, Australia
phase-contrast, micro-tomography, X-ray imaging, radiography, X-ray microscopy

NDT Review
Session: Materials (MDPI)
open document Andor Technology Enhances its Range of Cameras with a New USB X-Ray Capability
Andor12, Belfast, Ireland
Radiographic Testing (RT), Lithography, X-ray microscopy, instrumentation
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