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|NDT.net Issue - 2011-08 - NEWS |
|Wunstorf, Germany, 8 July, 2011. The Inspection Technologies business of GE Measurement & Control Solutions introduced its new in-line CT concept for industrial applications and its high resolution nanoCT laboratory system on its stand at GIFA, which took place in Dusseldorf from 28 June to 2July. Both CT systems demonstrate the depth of the companys expertise and the width of its portfolio, ranging from fast, automatic, 3D in-line inspection to high resolution, 3D materials analysis.
The prototype in-line scanner is being developed for fast in-line computed tomography of components such as light alloy castings and composite structures. It features a modified GE medical scanner and work pieces are conveyed through the tomography system simply and continuously on a conveyor belt, with no need for robotic handling. With Helix multi-line technology, the work pieces are scanned at speeds of up to several centimeters per second, and are automatically assessed with the aid of GEs own speed-optimized evaluation algorithms. These include for example automatic porosity analyses, or the classification of incorporated extraneous material. Because the 3D position, shape and size of the defects can be analyzed with reference to subsequent processing steps, fast inline CT can lead to a reduction in the reject rate. The prototype conceptual scanner was demonstrated every two hours during the exhibition.
The phoenix nanotom® is a laboratory nano-CT® system for high-resolution metallography. This has been specially developed to satisfy the rapidly growing demand for high-precision X-ray computed tomography (CT) for non-destructive 3D metrology and analysis. With its 180 kV high-power nanofocus X-ray tube, fully automatic CT scan execution, volume reconstruction and volume evaluation, it offers ease of operation as well as fast and reproducible results in a broad range of applications in materials science.
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