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NDT.net Issue - 2011-12 - NEWS

GE Holds Successful CT Symposium in Berlin Wide Range of Delegates at 7th GE X-Ray Forum



NEWS  
NDT.net Journal
Issue: 2011-12
WUNSTORF, GERMANY—October 11, 2011—Over 100 delegates from 28 countries attended the GE (NYSE: GE) X-Ray Forum, which took place in Berlin from August 29 – September 1. The symposium, which was organized by the Phoenix inspection business of GE Measurement & Control Solutions, gave attendees the opportunity to hear about the latest GE developments in industrial radiography and to listen to presentations from acknowledged experts in industrial radiography and X-ray computed tomography, who described their practical experiences in the field. Some indication of the success of the symposium is given by the fact that just a few days later, GE received a first order for a phoenix microme|x X-ray inspection system.

The proceedings were opened by Juan-Mario Gomez, GE’s global radiography leader, and after introductory presentations on the systems, software and solutions offered by GE, delegates listened to two days of papers on subjects as diverse as the use of X-ray imaging for failure analysis in the semi-conductor industry to the use of CT in palaeontology. Topics also included 2D and 3D casting inspection, 3D metrology, core sampling inspection in oil and gas and composites inspection in the aerospace and automotive sectors.

The event was concluded with a presentation from Joseph Portaz, of GE Aviation, who described GE’s use of non-volumetric CT for the dimensional inspection of turbine blades and an introduction to the imminent future of CT from Dr. Oliver Brunke, who talked about innovative concepts for in-line CT for mass production processes.

Copies of the various presentations are available on memory stick from Dirk Neuber at GE Measurement & Control Solutions.


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