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NDT.net Issue - 2012-05 - NEWS

Oxford Instruments launches new coating thickness analyser X-Strata920


Oxford Instruments Industrial Analysis3, Bucks [United Kingdom]
NEWS  
NDT.net Journal
Issue: 2012-05
New X-Strata920 from Oxford Instruments offers rapid and reliable XRF coating thickness measurement and materials analysis, combining sleek new design with improved stability and reliability, making a truly cost effective package.

- Improved stability and reliability
- Enhanced performance
- Compliant with safety and security requirements
- New ergonomic sleeker design
- Easy to use and fast to learn

Oxford Instruments is pleased to announce the new X-Strata920 X-ray fluorescence (XRF) analyser for coating thickness measurement and materials analysis. It combines a large area proportional detector and Oxford Instruments’ micro-focus X-ray tube, providing a high-intensity, small spot X-ray beam for superior sample excitation. This combination guarantees the best accuracy in its class, with analysis results obtained in seconds to ensure better process control and cost efficiency.

So whether you analyse solder alloys as part of your quality control process, or assay gold jewellery for valuation, or plating thickness in component manufacture, we believe the X-Strata920 is an ideal solution for your business, providing reliable analysis you need at a price you’ll like.

X-Strata920 performs excellent analysis and characterisation of multi-layer analysis across a wide range of industrial markets, including electronics, metal finishing, alloys and precious metals assay. For these industries, the X-Strata920 offers a number of benefits:

- Increase productivity with better process control
- Minimise production cost of the plating process and maximise production output
- Rapid, non-destructive analysis of jewellery and other alloys
- Rapid analysis of up to 4 coating layers
- Field-proven technology and better reliability ensuring value for money year after year
- Easy to use, with minimal user training required

The X-Strata920 is designed with ease of use, accuracy and value for money in mind. A large sample area can be analysed in one measurement cycle using the X-Strata’s multi-point analysis function. If a problem area is identified the operator can return to specific points with pin point accuracy for detailed investigation. With the analyser’s embedded camera and live video imaging, precise sample placement is assured. The X-Strata920 even allows unattended operation to ensure minimal downtimes of your production process.

The X-Strata920 comes with a choice of calibration packages tailored for a wide range of materials screening applications; the analyser is supplied with over 800 pre-loaded, easy-to-select application parameters/methods. To build consumer confidence the X-Strata920 meets international test methods such as ASTM B568 and ISO 3497.

With its advanced security and safety features, the X-Strata920 provides a simple user interface for the routine operator whilst assuring manager level access for system set up and preventing unauthorised use through its auto lock function. The improved reporting function allows seamless export to Excel within seconds and export in custom reports, including statistical data analysis and sampling images.

Oxford Instruments Industrial Analysis
Halifax Road, High Wycombe, Bucks HP12 3SE, UK
Tel: +44 (0) 1494 479278
Fax: +44 (0) 1494 524129
Email: judith.friesl@oxinst.com

More of Oxford Instruments Industrial Analysis published in NDT.net
2012-04-01: Oxford Instruments announces the new handheld XRF analyser X-MET7500 for professional materials analysis of light elements
2011-10-01: Oxford Instruments plc enters the FTSE 250


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