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|NDT.net Issue - 2012-05 - NEWS ||NDT.net Issue: 2012-05|
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
Oxford Instruments launches new coating thickness analyser X-Strata920Oxford Instruments Industrial Analysis3, Bucks, United Kingdom
New X-Strata920 from Oxford Instruments offers rapid and reliable XRF coating thickness measurement and materials analysis, combining sleek new design with improved stability and reliability, making a truly cost effective package.
- Improved stability and reliability
Oxford Instruments is pleased to announce the new X-Strata920 X-ray fluorescence (XRF) analyser for coating thickness measurement and materials analysis. It combines a large area proportional detector and Oxford Instruments micro-focus X-ray tube, providing a high-intensity, small spot X-ray beam for superior sample excitation. This combination guarantees the best accuracy in its class, with analysis results obtained in seconds to ensure better process control and cost efficiency.
So whether you analyse solder alloys as part of your quality control process, or assay gold jewellery for valuation, or plating thickness in component manufacture, we believe the X-Strata920 is an ideal solution for your business, providing reliable analysis you need at a price youll like.
X-Strata920 performs excellent analysis and characterisation of multi-layer analysis across a wide range of industrial markets, including electronics, metal finishing, alloys and precious metals assay. For these industries, the X-Strata920 offers a number of benefits:
- Increase productivity with better process control
The X-Strata920 is designed with ease of use, accuracy and value for money in mind. A large sample area can be analysed in one measurement cycle using the X-Stratas multi-point analysis function. If a problem area is identified the operator can return to specific points with pin point accuracy for detailed investigation. With the analysers embedded camera and live video imaging, precise sample placement is assured. The X-Strata920 even allows unattended operation to ensure minimal downtimes of your production process.
The X-Strata920 comes with a choice of calibration packages tailored for a wide range of materials screening applications; the analyser is supplied with over 800 pre-loaded, easy-to-select application parameters/methods. To build consumer confidence the X-Strata920 meets international test methods such as ASTM B568 and ISO 3497.
With its advanced security and safety features, the X-Strata920 provides a simple user interface for the routine operator whilst assuring manager level access for system set up and preventing unauthorised use through its auto lock function. The improved reporting function allows seamless export to Excel within seconds and export in custom reports, including statistical data analysis and sampling images.
Oxford Instruments Industrial Analysis