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|NDT.net Issue - 2012-06 - NEWS ||NDT.net Issue: 2012-06|
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
Micro- and Nano-CT also for Small Series InspectionMatriX Technologies GmbH13, Dachau, Germany
MatriX Technologies extends its portfolio with a new family for Micro Computed Tomography (µCT)
Feldkirchen, May 2nd, 2012 At the Control Show 2012 in Stuttgart (hall 3, booth 3122) MatriX Technologies presents a new, innovative system concept for micro computed tomography to the experts. The new µCT family extends the existing product portfolio for automatic AXI/CT inspection with a manual system providing a resolution of less than 0,5 µm. This high resolution allows inspection in the nano-scale area.
For the new system family the international supplier also relies on flexibility and modular design. Depending on application and requirements the systems can be equipped with different micro-focus x-ray tubes in a range of 130 kV to 240 kV as well as with high-resolution nano-focus x-ray tubes. In addition a variety of state-of-the-art detectors (CMOS, aSi, etc.) are available to provide optimum system configuration for the different inspection tasks. The reconstruction of the inspected part is always computed in real-time (online with the measurement), even for large data records and short measurement times. This is realized with fast hardware-based graphical cards.
The new µCT family can also run partly automated measurements for small series inspection. In the field of metrology the suppliers optionally offers specific and precise reconstruction methods. In several areas successive inspections or tests are not sufficient. Operators therefore ask for testing the parts under stress as well to be able to make more valid statements. The x-ray specialist offers for the first time a combination with other test units (tension, pressure, torsion, heat, cooling) allowing additional tests during the CT process. Next
to the classical non-destructive test, the new system family for micro CT is used in metrology, small series inspection and quality control. Other suitable application areas are research & development, sampling inspection during production or inspection during production start. The cross-sector technology is applied across all industrial sectors among others in the food, medical products, light metal casting, ceramics, plastics, sensors, automotive, aerospace industry.
In the past MatriX Technologies has already earned a word-wide reputation as specialist for customer specific system adaptions. With the new system for Nano-CT in combination with material test modules (tension, pressure, torsion) the supplier has realized a first cross-functional test environment at the TUM Weihenstephan.
MatriX Technologies also offers a complete service range of different x-ray and CT inspection and application tasks. The specialist has realized a major expansion of its demo center in Feldkirchen near Munich with significant investments in inspection equipment. Customers are invited to take advantage of decades of AXI experience and a wide range of services: x-ray analysis with transmission and CT technology, high resolution 1 micron technology and high power x-ray up to 450 kV.
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