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|NDT.net Issue - 2012-08 - NEWS ||NDT.net Issue: 2012-08|
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
NEW JCM-6000 NeoScope II with higher magnification and multi-touch screen control, and a sleek new designNikon Metrology, Inc.11, Brighton, MI, USA
July 20, 2012, Brighton, MI - As simple to use as a digital camera, the NeoScope II is a high resolution SEM that produces images with a large depth of field at magnifications ranging from 10X - 60,000X. It offers high & low vacuum operation, three selectable accelerating voltages, secondary electron, and back-scattered electron imaging. The NeoScope II accommodates samples up to 70mm in diameter and 50mm in thickness. The NeoScope examines both conductive and non-conductive samples without any special sample preparation. Optional EDS is available for elemental analysis.
Another new feature of the NeoScope II SEM is a touch screen interface with the familiar look and feel of today's smart phones and tablets. Automatic functions as well as pre-stored recipe files make it easy to use for a multitude of sample types. Any skill level of user will appreciate the simplicity and fast operation, from sample loading to imaging in vacuum in less than three minutes.
1) Simple operation
Visit www.nikonmetrology.com for more information about the JCM-6000 NeoScope II.
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