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NDT.net Issue - 2013-03 - NEWS

NDT Solutions, Inc Signs Distribution Agreement with Danatronics

NDT Solutions Inc4, New Richmond, WI [USA]
NDT.net Journal
Issue: 2013-03
New Richmond Wisconsin, USA – February 6, 2013 – NDT Solutions, Inc. (NDTS) and Danatronics Corporation have reached a long term Distribution and Marketing agreement. This agreement gives NDTS rights to the complete line of Danatronics instruments, including the EHC-09 Series and UPG-07 Series of ultrasonic thickness gages, iFlaw™ ultrasonic flaw detector, EZ-Scan 4™ encoder, and ultrasonic transducers.

NDT Solutions, Inc. (NDTS) is a forward thinking, leading edge Non-Destructive Testing solutions, sales and services company. They specialize in thinking outside the "Box" with innovative solutions to difficult inspection problems.

NDTS offers the complete line of MAUS® automated C-scan systems, the revolutionary VACRS (VAcuum Couplant, delivery and Recovery System) and the FlawInspecta® high speed ultrasonic array inspection systems. NDTS sells the complete line of EC/NDT eddy current probes, IMTT remote field eddy current instruments, NDTS ultrasonic transducers as well as the entire line of SONOTECH ultrasonic couplants and Genesis robotic non-destructive inspection systems.

Danatronics Corporation is a high technology company specializing in the field of Non-Destructive Testing (NDT). Danatronics combines the experience of more than 50 years of NDT know-how in the areas of Ultrasonic transducers, thickness gages and flaw detectors as well as offerings in Hall-effect thickness gages and video inspection equipment.

Contact Information:
NDT Solutions, Inc.
Scott Hansen
Marketing Manager
10-1 Airport Road
New Richmond, WI 54107
Tel: 715.246.0433
Email: scott@ndts.com

More of NDT Solutions Inc published in NDT.net
2013-08-01: Non Destructive Testing Solutions Inc. Embracing Innovation and Providing Solutions
2013-04-01: NDT Solutions, Inc Signs Distribution Agreement with PRAGMA
2013-02-01: NDT Solutions, Inc Signs Distribution Agreement with ETher NDE

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