where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
Beta-Version of this Page View
NDT.net Issue - 2013-04 - NEWS
NDT.net Issue: 2013-04
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
NEWS

Hamamatsu Photonics Integrated Microfocus X-ray Source

Hamamatsu Photonics32, Hamamatsu-city, Japan

Hamamatsu Photonics introduce a new very high power microfocus X-ray (MFX) source, the L10801. This new MFX features a 230 kV output power, the highest of any Hamamatsu MFX and is ideally suited for the inspection of high density metallic components used in electronic, industrial, aerospace and automotive industries.

The L10801 is a fully integrated, open type microfocus X-ray unit, consisting of X-ray head, power supply, cooler and control electronics all contained within a single compact module. The unit can provide a minimum spot size of just 7 microns making the L10801 suitable for the detection of very small cracks, defects, contaminants and artefacts. The output power of this new unit is increased up to a maximum of 230 Watts, and the X-ray voltage is adjustable over the range from 20 kV to 230 kV.

The L10801 is suited to applications requiring a very high power output X-ray source. Potential users include those inspecting high density metallic electronic products, such as thermoelectric coolers used for microprocessor temperature control, where low kV sources cannot be used.

As all Hamamatsu microfocus X-ray units are air cooled, they do not require oil emersion compared to conventional X-ray sources, making the new L10801 simple to integrate into an existing system.

For further information contact us on 01707 294 888 Email: info@hamamatsu.co.uk or visit our website: www.hamamatsu.com

 
Feedback: ()

Share:
More from "Hamamatsu Photonics" (5 of 33)
2017-04Hamamatsu Photonics Announces Completion of a New Building to Increase Production Capacity of Opto-Semiconductors and x-ray non-destructive inspection systems
2017-02Hamamatsu adds uncooled high-speed and high-sensitivity InAsSb device (3 to 11 μm) to infrared detector line-up
2016-08Hamamatsu Photonics UK Announces Technology Specialist in India
2016-04Hamamatsu New MEMS FPI Sensor
2016-04Hamamatsu New LED for CO² Measurement
... All 33 Details >
Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window