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|NDT.net Issue - 2013-07 - NEWS ||NDT.net Issue: 2013-07|
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
Olympus Introduces the BTX Profiler, a Combined XRD-XRF Analyzer for Comprehensive Materials AnalysisOlympus Scientific Solutions Americas (OSSA)235, Waltham, MA, USA
(Waltham, MA, USA - June 10, 2013) Olympus is pleased to announce the release of a new benchtop analyzer that combines X-ray Diffraction (XRD) and X-ray Fluorescence (XRF) in one unit. The BTX Profiler carries on the revolutionary XRD technology employed in NASA’s “Curiosity” Rover, part of the successful NASA Mars Science Laboratory program, and the highly acclaimed, award winning earthbound technology employed in Olympus Analytical X-ray Instruments. The BTX Profiler combines these to provide compositional materials analysis at the structural and elemental level affording economy of operational costs, space, and time with a seamless integration of data and results.
The Energy Dispersive XRF technology in the BTX Profiler integrates selectable optimized beam paths of a miniature X-ray tube and specialized filters, a large area silicon drift detector (SDD) for optimized resolution and detection limits, and close coupled geometry with the sample, allowing for a wide elemental and concentration measurement range.
The combination of all of these features reduces operational costs, space, and time of measurement while providing rapid, accurate and precise data analysis. The BTX Profiler’s nondestructive capability is of particular significance for several industrial sectors including energy, geochemistry, pharmaceuticals, catalysts, forensics and education.
For more information on the BTX Profiler, please visit http://www.olympus-ims.com/en/btx-profiler/.
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