|Buffalo, NY – In collaboration with Oxford Instruments, Eastern Applied Research continues their 2014 XRF “Roadshow” with the next event scheduled for the week of April 7th in Philadelphia, PA. The goal of the demonstration event is to bring x-ray fluorescence technology to interested parties and allow them an opportunity to work one-on-one with Application Specialists while reviewing the latest developments in XRF.
The featured analyzer is the popular X-Strata920 from Oxford Instruments, which has earned a reputation as a reliable and precise analyzer for quality control in coating thickness applications. In addition to the Philadelphia event, two additional 2014 events will be held in Florida and North Carolina and will also feature the X-Strata920 XRF analyzer.
Recently, the first of these demonstration events was held in Texas and attendees appreciated the one-on-one approach. Conversations included best practices to increase performance of any current XRF analyzers and a review of the benefits that the latest developments can offer.
“It was a great week in Texas,” noted Eastern Applied Research’s Director of Business Development, Shawn Kramer. “Most attendees already had XRF analyzers in place but having conversations about applications and analyzer features was really helpful to everybody”.
For over twenty years, Eastern Applied Research has provided x-ray fluorescence solutions for coating thickness measurement and material analysis needs. Information on the full range of available XRF analyzers, including the thickness gauges and X-Strata Series XRF analyzer product line from Oxford Instruments, can be found at www.easternapplied.com.
Contact: Shawn M. Kramer Sr.
Business Development Manager