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NDT.net Issue - 2014-06 - NEWS
NDT.net Issue: 2014-06
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)

GE Extends Its Portfolio of Ultrasonic Phased Array Straight Beam Probes

Waygate Technologies (former GE Inspection Technologies)313, Hürth, Germany

New MB.SPA16 Provides DGS Functionality to Offer Accurate Detection and Sizing of Defects

Huerth, Germany – May XX, 2014 – GE’s (NYSE: GE) Measurement & Control announced the latest addition to the portfolio of straight beam, phased array probes, the Krautkramer MB.SPA16. The new tool features both DGS functionality and phased array capability without the need for wedges.

Product features include:

  • Accurate ultrasonic detection and sizing of defects in welded joints, billet materials, medium castings and forgings, with a typical inspection thickness range of 10-100mm.
  • A contact surface with a smaller footprint than other circular probes in the portfolio, allowing for good coupling even when inspecting curved surfaces.
  • The high energy, longitudinal wave of the new probe is steerable over a sector scan of +/-45 degrees as a straight phased array probe and over a sector of +/- 35 degrees when used for DGS inspection.
  • Available in 2MHz and 4MHz versions and is housed in the same, field-proven ergonomic housing as GE’s MB.S conventional probes, with a replaceable, non-abrasive ES24-type membrane. This protects the contact surface and allows a long working life, even in harsh environments.

“Unlike conventional straight beam probes which require wedges to provide the various, discrete angles of inspection for a volumetric scan, the new probe produces inspection data in one degree steps without the need for wedges or wedge calibration,” said Weiwei Zhang, senior product manager at GE Measurement & Control. “This functionality significantly reduces inspection times, while providing more comprehensive inspection coverage.”

The patented DGS functionality of the transducer design is compatible with the specific software in GE’s Phasor XS flaw detector, and provides compliant defect sizing to the DGS method, which is specified in many countries worldwide as a sentencing technique. The probe can also be used for standard straight beam thickness measurement and phased array applications such as DAC sizing and dynamic focusing, where it can be used with other commercial flaw detectors. This means that it is now necessary to carry just one single probe to carry out a wide range of inspections.

About GE
GE (NYSE: GE) works on things that matter. The best people and the best technologies taking on the toughest challenges. Finding solutions in energy, health and home, transportation and finance. Building, powering, moving and curing the world. Not just imagining. Doing. GE works. For more information, visit the company's website at www.ge.com.

About Measurement & Control Measurement & Control is a leading innovator in advanced, sensor-based measurement; non-destructive testing and inspection; flow and process control; turbine, generator, and plant controls; and condition monitoring. Providing healthcare for our customers’ most critical assets, we deliver accuracy, productivity and safety to a wide range of industries, including oil & gas, power generation, aerospace, metals and transportation. Headquartered in Boston, USA, Measurement & Control has more than 40 facilities in 25 countries and is part of GE Oil & Gas. For further information, visit www.ge-mcs.com.

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