- since 1996 -
|NDT.net Issue - 2014-07 - NEWS ||NDT.net Issue: 2014-07|
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
Kubtec Releases Upgrades to XPERT 80™ Digital X-Ray System for Non-Destructive TestingKubtec Digital X-ray, Milford, United Kingdom
Kubtec’s Ultra-High Resolution X-Ray System Boasts New Features for Prototype Development, Medical Device Manufacturers, Aerospace and Defense Industries
MILFORD, CT (June 16, 2014) – Digital X-ray manufacturer Kubtec today announced its newly upgraded XPERT 80—a digital cabinet x-ray system for ultra-high resolution imaging and non-destructive testing (NDT). The XPERT 80™ integrates the company’s proprietary feature-rich Digicom™ image acquisition and analysis software to produce the highest quality images for R&D and quality assurance.
“With a pixel size of 0.048 mm, the XPERT 80 gives users the highest resolution image quality available,” said Dr. Chester Lowe, Director of Research and Development at Kubtec. “The new XPERT 80 includes Kubtec’s powerful automatic image enhancement software, eliminating the need for manual adjustments.”
“The updated system provides research and design and quality assurance teams the ability to inspect objects of varied shapes and thicknesses with accuracy, ease, and a level of precision that will set the new standard for digital radiography inspection quality,” said Dr. Bill Thoma, Director of Non-Clinical Products for Kubtec.
Compact and easy to use, the XPERT 80 requires no specialized training to operate. The updated XPERT 80 optimizes image detail, quality, and accuracy while streamlining the inspection process. Kubtec’s line of digital x-ray systems for NDT serve multiple industries, including prototype development, medical device manufacturing, aerospace and defense industries.