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NDT.net Issue - 2014-12 - NEWS
NDT.net Issue: 2014-12
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
NEWS

Interview with Juan Mario Gomez from GE at the ECNDT 2014 Exhibition

Waygate Technologies (former GE Inspection Technologies)313, Hürth, Germany

 
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