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NDT.net Issue - 2016-06 - NEWS

New Book: Defect Sizing Using Non-destructive Ultrasonic Testing

Springer-Verlag2, Berlin [Germany]
NDT.net Journal
Issue: 2016-06
Applying Bandwidth-Dependent DAC and DGS Curves

Autor: Kleinert, Wolf
ISBN 978-3-319-32836-2

Presents an approach to bring both sizing methods DGS and DAC close together.
Proposes an idea to increase sizing methods productivity significantly.
Author with 30+ years experience working in industry and 10+ patents in the field.

This book presents a precise approach for defect sizing using ultrasonics. It describes an alternative to the current European and American standards by neglecting their limitations. The approach presented here is not only valid for conventional angle beam probes, but also for phased array angle beam probes. It introduces an improved method which provides a significant productivity gain and calculates curves with high accuracy. Its content is of interest to all those working with distance gain size (DGS) methods or are using distance amplitude correction (DAC) curves.

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