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NDT.net Issue - 2018-05 - NEWS
NDT.net Issue: 2018-05
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
NEWS

SIUI attended the 32nd Control

SIUI (Shantou Institute of Ultrasonic Instruments Co.,Ltd.)12, Shantou, China

SIUI attended the Control Exhibition in Stuttgart, Germany, showcasing featured products like PAUT/TOFD ultrasonic flaw detector SyncScan with low profile crawler LPS-01, new product Smartor, and thickness gauge CTS-30C. Phased array solution at the show attracted much attention.

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