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- since 1996 -
NDT.net Issue - 2008-03 - NEWS
NDT.net Issue: 2008-03
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
NEWS

XY Axis manual Scanner

TecScan Systems28, Boucherville, Quebec, Canada

This manual scanner consists of an XY entry level inspection device specifically made to be interchangeably used with UT, EC, PEC and TOFD technologies. With an indexing mechanism on each of the X and Y axis, scans can be performed more rapidly and efficiently. In addition, each axis is equipped with an optical encoder ensuring accurate scanning and high resolution. An articulated transducer support improves the contact between the probe and the inspected part. The scanner comes equipped with magnetic basis or rubber leveling pads. An optional vacuum support system can be added for vertical or overhead inspections.

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Combined with a portable workstation and one of our TecViewTM Lite software packages, this manual scanner becomes a complete integrated solution which enables the user to obtain inspection results comparable to the ones generated by automated or immersion scanners.

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ABOUT TECSCAN SYSTEMS
TecScan designs and manufactures NDT Scanners & Systems which incorporate Ultrasonic, Eddy-Current, Pulsed Eddy Current as well as Time of Flight Diffraction technologies. Our systems range from small hand-held scanners to large automated in-line manufacturing systems and from immersion scanners to large squirter/gantry systems. In addition, TecScan designs and develops custom inspection systems that can be integrated into existing production lines. We have taken many years of research and product development, knowledge and experience, to benefit the aerospace, manufacturing, laboratory and infrastructure industries with systems that ensure structural integrity in materials ranging from steel to aluminum, titanium to composites and beyond.

Keywords: Electromagnetic Testing (ET) (1345), Ultrasonic Testing (UT) (4107), eddy current testing (ECT) (564), time-of-flight diffraction (TOFD) (131), instrumentation (454), Scanner (42),
*Keywords are freely formed keywords from the authors and thus you may Search also for similar terms.  


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