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NDT.net Issue - 2008-07 - NEWS

Skyray XRF Releases New Non-Destructive Analyzers to Help Increase Efficiency


Skyray XRF3, Georgetown [USA]
Radiographic Testing (RT), x-ray fluorescence, instrumentation, materials characterization
NEWS  
NDT.net Journal
Issue: 2008-07
Skyray XRF offers two new non-destructive x-ray fluorescence instruments to the North American market. One XRF analyzer features a sixteen-sample turret stage while the second is a portable model that provides the accuracy of a desktop system.

Seaford, DE – Continuing to offer "The New Choice in XRF Technology" Skyray XRF will add to its versatile and reliable line of non-destructive x-ray fluorescence (XRF) analyzers. Two new XRF models, the EDX-6000B and EDX-660, have recently been approved for release to The United States, Canada and Mexico. Both new options offer features that can help increase the efficiency and production of an organization.

The EDX-6000B is a compact desktop model featuring a turret stage that can hold up to sixteen (16) samples at once. This automatic sample changer increases the efficiency of a laboratory by analyzing multiple samples with the push of a button. The instrument user can insert samples once, start the instrument and leave it to analyze as required. The model is a versatile system; offering top performance in RoHS testing (lead content detection), metallurgy and building materials analysis. It is capable of analyzing the greatest elemental range available because of the vacuum chamber that comes standard and it is the first Skyray XRF to feature the new Ultra-High Resolution Detection System (UHRD); which provides resolution under 130eV.

The second new release is a portable XRF analyzer that performs with the accuracy of a desktop system. The EDX-660 features a Micro-XRF system that is housed within a durable hard-body travel case featuring wheels and a handle similar to a piece of luggage. The case holds both the XRF chamber and a micro-computer. The mobile unit was designed for mining and geological applications but will meet a wide range of testing needs and increase efficiency by allowing precise laboratory equipment to be taken from location to location. Two variations of the unit are offered; the EDX-660 utilizes a proportional counter detector tube while the EDX-660P offers the increased capabilities of a PIN-Diode detection system.

“The goal of Skyray XRF is to provide a range of non-destructive analytical instruments that will help organizations and laboratories meet their goals with increased efficiency,” stated Scott Kramer, Director of Sales and Marketing for Skyray XRF. “The two new releases were selected because of their performance and the features that will allow an organization to have greater production possibilities.”

Skyray XRF is the North American representative of an international leader in non-destructive x-ray fluorescence technology; offering hand held portable XRF and desktop models. Overviews of the full product line, applications and XRF technology can be found at www.skyrayxrf.com. Skyray XRF can be reached by phone at 716-204-2388 to discuss a specific application or instrument.

Contact:
Jeff Henseler
Marketing Manager
Phone: 716-204-2388
www.skyrayxrf.com

More of Skyray XRF published in NDT.net
2008-12-01: Skyray XRF Releases Newest Model for Coating Thickness Measurements
2008-05-01: New Portable XRF


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