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|NDT.net Issue - 2008-08 - NEWS ||NDT.net Issue: 2008-08|
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
New Meteor1D XRD Detector from GE Sensing & Inspection TechnologiesWaygate Technologies (former GE Inspection Technologies)311, Hürth, Germany
The new Meteor1D detector is the result of many years of development, deriving initially from academic synchrotron research. It uses the single photon counting principle and incorporates the latest semiconductor technology. Meteor1D is a maintenance-free detector which requires no gas nor even the minimum of cooling. No Beryllium is employed and the detector complies with the most stringent health and safety regulations.
The Meteor1D detector has been designed to meet the requirements of the market, both today and in the future. It features a 64mm window to offer an exceptional capture angle which translates into extremely high speed. For example, measurement times are reduced by a factor of 200 when taking diffractograms compared with conventional detectors, allowing significant savings in time and costs. Similarly, read-out times of only 0.3ms make the detector ultra-fast, when compared with read-out times of the order of 100ms exhibited by many competitive detectors.
Versatility is another benefit of the new detector as it can be operated both as a point (0D) and a linear (1D) detector. In static and in scanning mode, with energies ranging from 5keV (Cr) to 18keV (Mo), with a detection efficiency greater than 98% for copper. By designing the detector housing to accommodate a wide detection angle (2 Theta) of more than 170º, it is possible to perform stress measurements with extremely high reliability and accuracy.
The Meteor1D can be easily retrofitted into existing Seifert XRD3000 and XRD3003 diffractometer systems and manipulation and handling systems can be designed to meet specific customer requirements.
About GE Sensing & Inspection Technologies
Visit: Waygate Technologies (former GE Inspection Technologies)