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NDT.net Issue - 2008-09 - NEWS
NDT.net Issue: 2008-09
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
NEWS

TECSCAN?S Table-Top Scanner

TecScan Systems24, Boucherville, Quebec, Canada

Our Table-Top Scanner consists of a versatile three axis (X-Y-Z) laboratory scanner specifically designed to perform eddy current, pulsed eddy current and ultrasonic inspections. The axes are mounted on an industrial grade table, ensuring high stability and rigidity. A spring loaded probe support is mounted on the Z axis in order to ensure constant probe contact with sample as well as to permit contour following of curved surfaces during inspections. The scanner’s elevated Y-Axis bridge and its automated Z-Axis enable the inspection of a wide range of sample sizes and shapes.

TecScan offers a completely integrated solution incorporating our table top scanner, an industrial enclosure housing all the required electronics, a workstation as well as our TecView™ software package. This user friendly software helps manage the entire NDT procedure, all the way from scanner motion control to data acquisition and analysis. In addition, our Table Top scanner can be customized to satisfy specific requirements.

ABOUT TECSCAN SYSTEMS
TecScan designs and manufactures NDT Scanners & Systems which incorporate Ultrasonic, Eddy-Current, Pulsed Eddy Current as well as TOFD technologies. Our systems range from small hand-held scanners to large automated in-line manufacturing systems and from immersion scanners to large squirter/gantry systems. In addition, TecScan designs and develops custom inspection systems that can be integrated into existing production lines. We have taken many years of research and product development, knowledge and experience, to benefit the aerospace, manufacturing, laboratory and infrastructure industries with systems that ensure structural integrity in materials ranging from steel to aluminum, titanium to composites and beyond.

Keywords: Electromagnetic Testing (ET) (1344), Ultrasonic Testing (UT) (4095), eddy current testing (ECT) (563), instrumentation (453), Scanner (42),
*Keywords are freely formed keywords from the authors and thus you may Search also for similar terms.  


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