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|NDT.net Issue - 2008-09 - NEWS |
|Billerica, MA Aug. 18, 2008. GE Sensing & Inspection Technologies, a global provider of advanced measurement, sensor-based and inspection solutions, announces Meteor1D, the latest addition to the evolving Meteor detector family for X-ray diffraction. The Meteor1D detector is designed to meet the requirements of the market, both today and in the future. The increased detection and read-out speed make the Meteor1D ideal for a wide range of applications within many industries such as automotive and aerospace as well as in research and development facilities.
We are excited to add 1D to our growing Meteor detector family, said Bernhard Karbach, General Manager Testing Machines. Designed with versatility in mind, the Meteor1D can be used across multiple industries for multiple purposes which makes it a great investment for our customers.
The Meteor1D features a 64mm window to offer an exceptional capture angle that translates into extremely high speed. With its speed and versatility, it can be operated as both a point and a linear detector, it can be used for a wide range of applications including phase analysis and determination of retained austenite, kinetic experiments, involving in-situ phase transformations and residual stress, texture and thin film analysis. Typically, these applications are found in R&D departments at universities, research centers and in industrial organizations. In industries such as aerospace and automotive, X-ray diffraction is seen as a valuable quality assurance tool.
The new Meteor1D detector is the result of many years of development, deriving initially from academic synchrotron research. It uses the single photon counting principle and incorporates the latest semiconductor technology. Meteor1D is a maintenance-free detector, which does not require gas or even the minimum of cooling. No Beryllium is employed and the detector complies with the most stringent health and safety regulations.
The Meteor1D can be easily retrofitted into existing SEIFERT XRD3000 and XRD3003 diffractometers. In addition manipulation and handling systems can be designed to meet specific customer requirements.
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