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NDT.net Issue - 2008-09 - NEWS
NDT.net Issue: 2008-09
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)
NEWS

Andor Technology Enhances its Range of Cameras with a New USB X-Ray Capability

Andor12, Belfast, Ireland

Belfast, Northern Ireland, 19 August 2008 – Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, today announced the launch of their new iKon-M X-ray camera. This extension to the established ‘iKon’ family of low light imaging cameras is designed to deliver high-performance solutions to direct detection X-ray needs, and is available in two variants: DO and DY. The DO variant interfaces easily with vacuum chambers, whereas the DY variant is a ‘stand-alone’ camera with a beryllium input window.

The new camera offers very low read noise floor, high QE across the X-ray, XUV and EUV energy ranges, and boasts negligible dark current with thermoelectric cooling to as low as -90ºC, ideal for maximizing signal to noise for low photon flux applications. Readout speeds of up to 2.5 MHz enable faster frame rate imaging of dynamic processes.

Dr Colin Coates, Market Development Manager within Andor Technology, said; "We are delighted to announce the launch of this latest addition to our X-ray family of cameras. The iKon-M X-ray offers unparalleled thermoelectric cooling and ultra low noise readout, making it ideal for a range of applications including; Soft X-ray imaging, Lithography, X-ray microscopy, Beam profilometry, and Plasma diagnostics”.

For more information, please visit
http://www.andor.com/scientific_cameras/x-ray/

Keywords: Radiographic Testing (RT) (1523), instrumentation (453), Lithography (1), X-ray microscopy (2),
*Keywords are freely formed keywords from the authors and thus you may Search also for similar terms.  


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