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NDT.net Issue - 2008-10 - NEWS

Innovative ?super-resolution? microscopy method developed using Andor?s iXon+ EMCCD cameras.


Andor12, Belfast [Ireland]
Visual and Optical Testing (VT/OT), microscopy, instrumentation
NEWS  
NDT.net Journal
Issue: 2008-10
Belfast, Northern Ireland, 10 September 2008 - Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, today reported that their performance leading iXon+ EMCCD cameras have been used in the development of a new structured illumination microscopy approach that delivers ‘sub-diffraction’ resolution at high speed.

The instrument has been developed by a team from the University of San Francisco, led by Prof. John Sedat, Assist. Prof. Mats Gustafsson, and Dr. David Agard, and is based on the employment of diffracted laser light to create a pattern of multiple interfering illumination beams. Capture of images over several orientation of the beams incident on the sample, followed by intensive computational treatment, results in a final image with spatial resolution that is at least twice as fine as the 200 - 300nm best case resolution of classical microscopy. Electron microscopy cannot be performed on living cells, and furthermore, is not compatible with use of fluorescent tags for greater specificity. The structured illumination set-up from UCSF has been successfully demonstrated on challenging sub-nuclear structural investigations (this work was published in the June 6, 2008 issue of Science).

Prof Sedat said, "Using a parallel array of Andor’s iXon+ 897 EMCCD cameras as detectors, we have been able to develop this instrument with enhanced sensitivity and speed, critical to realize the implementation of the technique for high resolution imaging of challenging live specimens within a reasonable measurement period".

Dr. Colin Coates, Market Development Manager within Andor, concluded, “This is a highly significant advance since much sub-cellular detail is hidden by the classical diffraction limit of light microscopy. We are very pleased that our high performance cameras have helped Prof. Sedat to successfully develop a new structured illumination approach for high resolution microscopy”.

For more information, please visit www.andor.com/scientific_cameras/ixon/

More of Andor published in NDT.net
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2010-06-01: Highly-sensitive EMCCD camera helps redraw the boundaries of super-resolution 3D imaging
2010-02-01: Andor Technology Pushes Interline CCD Performance Even Further ...
2009-11-01: First direct measurements of trace pollutants in fresh vegetables using laser plasma spectroscopy
2009-03-01: New camera vendor delivers more efficient fault detection for fast inline solar cell inspection.
2009-02-01: New Spectrograph with Imaging Capability launched at Photonics West
2008-12-01: Andor Builds upon its Strong Position in Japan
2008-11-01: New Portable 1064nm Raman Spectroscopy
2008-11-01: More Power and Flexibility for Live Cell Imaging Software
2008-10-01: Andor announces a new webcast on "EMCCD for Spectroscopy"
All 12 Articles & News of Andor in NDT.net


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