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NDT.net Issue - 2008-10 - NEWS
NDT.net Issue: 2008-10
Publication: e-Journal of Nondestructive Testing (NDT) ISSN 1435-4934 (NDT.net Journal)

X-ray sensitive line-scan camera announced at ASNT Digital Imaging Conference

X-Scan Imaging Corp.2, San Jose, CA, USA

X-Scan Imaging Corporation, the only domestic manufacturer of buttable x-ray sensitive line-scan detectors introduced its new line of XR8800 x-ray line-scan cameras at the recent ASNT Digital Imaging XI Exhibit & Conference in Mashantucket, Connecticut. At the exhibit, X-Scan Imaging demonstrated the speed capabilities of its 0.4-mm-resolution XR8804 Camera by capturing image data at over 4500 lines per second. The XR8800 Series Line-scan Camera incorporates X-Scan Imaging’s CMOS silicon imaging detector array chips providing wide dynamic range and solid-state reliability. The chips can be butted together and mounted on a PC board to form a variety of active detector lengths ranging from 6 to 12 inches, in 2 inch increments.

A wide selection of scintillation materials is available for converting x-ray radiation into visible light for detection by the imaging array, which optimizes both sensitivity and image resolution. Applications include printed circuit board inspection, industrial inspection and NDT, airport security and cargo screening.

A complete product datasheet containing full performance specifications can be downloaded from our Products Page. For pricing and delivery information contact sales@x-scanimaging.com

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